How to Perform Low Current Pulse Measurements

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Modular PXIe Source Measure Unit
+ Modular PXIe Source Measure Unit
Modular PXIe Source Measure Unit
+ Modular PXIe Source Measure Unit

Low Current Pulse IV Testing

Low current and narrow pulse measurement requires sourcing precise voltage or current while capturing extremely small current responses with minimal noise. The test setup typically uses a source measure unit (SMU) to perform current versus voltage (IV) characterization, including reverse bias leakage measurements and pulsed forward current testing. Accurate measurements depend on low-noise connections, optimized aperture time, and controlled measurement delays to reduce settling effects and dielectric absorption.

The measurement process involves configuring voltage sweeps or pulse signals, capturing current responses across femtoampere to milliampere ranges, and analyzing transient and steady-state behavior. Narrow pulse testing requires high sampling rates to capture fast transitions, while step response measurements verify settling time and slew rate performance. These methods enable characterization of semiconductor and optical devices under both DC and transient conditions.

Low Current Pulse Measurement Solution

Low current pulse measurement requires precise sourcing and accurate current detection across a wide dynamic range while maintaining low noise and fast transient response. This solution uses a PXI Express (PXIe) precision source measure unit (SMU) to perform both DC and pulsed IV characterization. It supports measurements from femtoampere-level currents to hundreds of milliamps and enables narrow pulse generation down to microsecond ranges. The system integrates high-resolution measurement capability, fast sampling rates up to megasamples per second, and digitizing functions to capture transient responses. It supports reverse bias leakage testing, pulsed forward current measurement, and step response analysis. With configurable sweep parameters, trigger control, and data export capabilities, the solution enables repeatable and automated semiconductor device characterization in both laboratory and production environments.
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How to Perform Low Current Pulse Measurements

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