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keysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:product-lines/1h,keysight:models/b1/b1500akeysight:models/uu/uu102lab,segmentation:campaign/Education,segmentation:funnel/tofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/CSG,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,keysight:pr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Descubra cómo esta solución para laboratorios de enseñanza de semiconductores se centra en las pruebas paramétricas y las mediciones sobre oblea. Ofrece a las universidades un entorno de aprendizaje completo y adaptado a las necesidades del sector, que permite a los estudiantes familiarizarse con las prácticas reales de medición de semiconductores.
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