Course

Semiconductor Parametric Characterization – Part 1

Courses
13 items

Explore the fundamentals and advanced techniques of semiconductor characterization with this comprehensive bootcamp. Through webinars, application notes, and Keysight’s industry-leading handbook, you’ll gain hands-on skills to tackle real-world challenges in parametric characterization, whether you’re validating bare chips, optimizing source measure units (SMUs), or simulating designs for faster time-to-market.

Learn:

Core principles of parametric testing (CV-IV, quasi-static vs. high-frequency methods).
SMU best practices for accurate low-level measurements and virtual prototyping with ADS.
Advanced power device characterization, including gate charge (JEDEC) and ultra-low Rds-on for SiC/GaN.
Digital Learning Suite for test automation and remote education.

This bootcamp is ideal for Semiconductor design and development engineers or anyone interested in semiconductor parametric characterization.

Lessons

Lesson 1 - What is Semiconductor Parametric Test?

Introduces the concept of capacitance in semiconductor devices and discusses the different types of capacitance that can be measured.

Lesson 2 - Measurement Basics

Discusses the different methods that can be used to measure capacitance, including quasi-static and high-frequency methods.

Application Notes

The Parametric Measurement

The latest version (Edition 5) of Keysight Technologies’ popular Parametric Measurement Handbook is now available. Since its initial release in 2010, this handbook has proven itself to be an invaluable reference tool for scientists, engineers and technicians involved with any aspect of parametric test. It is filled with tips to help both novice and advanced users, and the latest edition includes new sections on modular SMUs, high-resistance test, non-volatile memory test, and double pulse testing of power semiconductor devices.   Key topics covered in this handbook: <ul> <li>Parametric measurement basics</li> <li>SMU fundamentals</li> <li>On-wafer parametric measurements</li> <li>Time-dependent and high-speed measurements</li> <li>Resistance, diode and transistor measurements</li> <li>Semiconductor capacitance measurement</li> <li>Power device characterization</li> </ul>

Lesson 3 - Source/Measure Units (SMUs) for Parametric Test

Provides a detailed overview of the quasi-static method for measuring capacitance.

Lesson 4 - Tips for Making Accurate Low-Level Measurements

A detailed overview of the high-frequency method for measuring capacitance.

Lesson 5 - SMU Portfolio

Discusses the different components that are required to create a complete CV-IV measurement solution.

Case Studies

ADS Helps SiGe Semiconductor get Virtual Samples to Market Fast

See how SiGe semiconductor uses ADS RFIC design from Keysight to provide virtual samples to their customers and has over 30 customer IC design wins.

Application Notes

Static and Dynamic Gate Charge Measurement

This application note helps you understand gate charge measurement for optimal power circuit design performance.

Application Notes

Ultra-Low On-Resistance Measurements of SiC MOSFETs

This application note outlines tips to measure ultra-low Rds-on with the B1505A Power Device Analyzer/Curve Tracer.

White Papers

Dynamic Characterization of a Power Semiconductor Bare Chip

This white paper describes the challenges of making dynamic measurements on a bare power semiconductor chip and how Keysight overcomes these challenges using various, unique technologies.

Application Notes

Empower Semiconductor Teaching by Digital Learning Suite

This application note explains the process of measuring MOSFETS and using an SMU to determine IV measurements.

Solution Briefs

Characterize Wide Bandgap Semiconductors

Keysight’s all-in-one test solution helps you characterize wide-bandgap semiconductors using a double-pulse testing system to ensure a safe environment for users.

Lesson 6 - Summary and Additional Resources

Summary of the key concepts covered in the course and provides links to additional resources.

Related Product

Related Use Case