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Manufacturing Test User Group Meeting (UGM) 2024
Delve into emerging tech trends and gather actionable insights from top industry minds during our Manufacturing Test User Group Meeting (UGM).
Your Path to Manufacturing Test Excellence
Every success in manufacturing test excellence starts somewhere, from the exchange of knowledge among tech pioneers to the seamless integration of cutting-edge innovations. Join us as we unfold these stories, celebrate the milestones, and inspire your own chapter of success.
Manufacturing Test User Group Meeting
Discover Manufacturing Testing Excellence: Join us at the annual Keysight Customer User Group Meeting, where industry leaders and experts convene to share knowledge and insights on the latest manufacturing testing challenges and solutions. Engage with notable speakers, explore knowledge sessions covering data-driven manufacturing and advanced technologies, and witness ICT NPI showcase. Our engaging demo booths, interactive games, and interview sessions promise an immersive experience. Plus, seize the chance to win exciting quiz draw prizes. Notable industry players, from Jabil and Intel to newcomers like Cisco and Broadcom, underscore the event's industry influence. Don't miss the opportunity to elevate your expertise and network with the best in the field.
1 Day, 2 Tracks, 5 NPIs: Your Passport to Knowledge
At our UGM, join tech visionaries and analysts as they engage you in an opening keynote on near-term trends, an industry panel discussing key challenges ahead, and a future-looking closing keynote.
Keynote Presentation
Our event features distinguished speakers who will share their knowledge on a range of industry challenges and innovative solutions, providing valuable insights that can shape your approach to manufacturing testing.
Knowledge Session
Dive into a series of informative sessions covering essential topics. Explore and stay up-to-date with the latest advancements.
Exclusive NPI Showcase
Get an exclusive look at our latest offerings in the world of In-Circuit Test New Product Introduction (ICT NPI). Witness how our technology can revolutionize your testing processes
Demo Booth
Interact with our engaging demo stations to explore in-circuit and board test systems, Big Data Analytics, boundary scan solutions, Keysight services, and partner demos. Participate in our booth game for added fun and the chance to win exciting prizes.
Engagement Opportunities
Engage with us for knowledge exchange, quizzes, interviews, and the chance to win quiz draw prizes. We're dedicated to fostering a dynamic learning environment for all participants.
Meet Keysight's Tech Leaders
Hear from Keysight's leaders and technology experts on manufacturing tests.
Carol Leh
Vice President / General Manager
Electronic Industrial Solutions Group (EISG)
Yapp Poey Hee
Director of Product Management
Electronic Industrial Solutions Group (EISG)
Sam Wong
Business Development Manager
Electronic Industrial Solutions Group (EISG)
Andrew Tek
Product Planning Manager
Electronic Industrial Solutions Group (EISG)
Peter Mosshammer
Business Development Manager
Automotive and Energy Solutions (AES)
Electronic Industrial Solutions Group (EISG)
Adrian Gaudencio Ababa
Business Development Manager
Automotive and Energy Solutions (AES)
Electronic Industrial Solutions Group (EISG)
NPI Previews
High Node Count Inline ICT
The Keysight i3070 Series 7i E9988GL inline, high node count in-circuit test (ICT) system has Quad-Density pin cards that can provide up to 5760 test nodes in a slim footprint. This enables manufacturers to economically meet increasing test demands for large printed circuit board assembly (PCBA). It also protects manufacturers’ existing investments by maintaining backward compatibility with Keysight i3070 Series 5i E9988E / E9988EL test programs, including fixtures.
MFT 19” i3070 test handler
The MFT 19" i3070 test handler, exclusively sold by IPTE, is designed primarily for European customers. This versatile test handler supports up to 2 modules and can be configured for either single-lane or dual-lane operation.
By integrating Keysight's in-circuit test capabilities, IPTE offers a high-performance solution tailored to unique requirements.
x1149 2.1 Boundary Scan Analyzer
Further enhance your testing capabilities with the x1149 2.1. This state-of-the-art system, compliant with the latest IEEE standards can be integrated with the i3070 or used as a standalone solution. Recover the test coverage of mission-critical ICs lost due to the limited access to electronic nodes enabling confidence in the quality of your shipped automotive electronics.
Combined ICT and FCT
A scalable combined in-circuit test (ICT) and functional component/circuit test (FCT) system breaks the traditional split of systems. Ultimately, this offers customers the flexibility to combine and streamline test coverage of both ICT and FCT, providing a more efficient balance between throughput and test coverage, which helps customers achieve improvements in cost-of-test.
Big Data Analytics
Combining test and measurement expertise with data science and big data engineering, the PathWave Manufacturing Analytics platform provides actionable insights for every level in your organization in the smart factory of the future. Improve yield, lower retest, and handling, and lower the cost of poor quality with big data advanced analytics that really works. Accelerate your Return on Investment and business outcomes with unique, innovative analytics.
Explore Tomorrow's Tech Landscape
Key Topics at UGM Event
Industry Keynote of Emerging Trends
Industry Keynote of Emerging Trends and Technologies in Radar, LIDAR and Scaling Manufacturing Tests
Keysight Manufacturing Test Technology Portfolio
Exploring the Keysight Manufacturing Test Technology Portfolio: A comprehensive journey from offline ICT to inline ICT, along with diverse software solutions designed to elevate your manufacturing test experience.
Exclusive New Product Introduction (NPI) Showcase
Exclusive New Product introduction (NPI) Preview: Unveiling the i3070 High-Node-Count Inline In-Circuit Test System Tailored for Automotive Electronics Testing. Discover Strategies to Enhance Test Throughput with the i7090 Massively Parallel Board Test System. Explore New X1149 Boundary Scan Analyzer Standards for Maximizing Test Coverage.
Never-Before-Seen Solutions
Go behind the scenes! Get an insider scoop on never-before-seen product releases and a first-hand demonstration of our prototype solutions.
UGM Schedule
Suzhou UGM Dec 2023
Date: 15 December 2023
Time: 9:00 AM to 4:00 PM
Venue: Crowne Plaza Suzhou
Hall: Santorini Level B2
Upcoming UGM 2024
Please stay tuned for more upcoming UGM events.
Agenda
| Time | Topics |
|---|---|
| 9:00 - 9:30 | Registration |
| 9:30 - 9:40 | Welcome speech |
| 9:40 - 9:50 | Keysight Technologies follows you everywhere – from ICT, FCT to Industry 4.0 |
| 9:50 - 10:00 | All new i3070 Series 7i High Node Count Inline In-Circuit Test (ICT) System |
| 10:00 - 10:10 | i7090 Massively Parallel Board Test System |
| 10:10 - 10:20 | The evolution of boundary scan: IEEE 1149.1-2013, 1149.6-2015 |
| 10:20 - 10:40 | Break and Demonstration |
| 10:40 - 11:10 | PathWave: Digital Driven Intelligent Manufacturing ‑ Automotive Electronics Case |
| 11:10 - 11:30 | Simplifying your Electric Vehicle (EV) parts with modular, easily scalable test solutions for manufacturing tests |
| 11:30 - 11:50 | Support and accelerate your product innovation in autonomous driving |
| 11:50 - 13:10 | Lunch break |
| 13:10 - 13:30 | The Concealed Flaws in Semiconductor Packaging: Unveiling the Risks for Automotive-Grade Chips |
| 13:30 - 13:50 | Ensure ICT system measurement accuracy and asset compliance with Keysight's original calibration |
| 13:50 - 15:40 | Live Demo and Discussion Sessions by Group
|
| 15:40 - 16:00 | Q&A, Lucky Draw |
Highlights From our Past UGM Event
UGM 2023 Penang Interview
4 minutes
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