Manufacturing Test User Group Meeting (UGM) 2025

Electrical Structural Tester

Leveraging advanced nanoVTEP technology, the Electrical Structural Tests (EST) solution utilizes capacitive and inductive sensing techniques to detect wire bond defects with exceptional precision and efficiency, including near-shorts, stray wires, wire sweeps, and wire sags. Additionally, the EST system effectively addresses Electrical Overstress (EOS) challenges that could affect chip integrity. This helps manufacturers deliver high-quality components, reduce product returns, and ensure the reliability and consistency of electronic products throughout their lifecycle.

High Node Count Inline ICT

The Keysight i3070 Series 7i E9988GL inline, high node count in-circuit test (ICT) system has Quad-Density pin cards that can provide up to 5760 test nodes in a slim footprint. This enables manufacturers to economically meet increasing test demands for large printed circuit board assembly (PCBA). It also protects manufacturers’ existing investments by maintaining backward compatibility with Keysight i3070 Series 5i E9988E / E9988EL test programs, including fixtures.

MFT 19” i3070 test handler

The MFT 19" i3070 test handler, exclusively sold by IPTE, is designed primarily for European customers. This versatile test handler supports up to 2 modules and can be configured for either single-lane or dual-lane operation.

By integrating Keysight's in-circuit test capabilities, IPTE offers a high-performance solution tailored to unique requirements.

x1149 2.1 Boundary Scan Analyzer

Further enhance your testing capabilities with the x1149 2.1. This state-of-the-art system, compliant with the latest IEEE standards can be integrated with the i3070 or used as a standalone solution. Recover the test coverage of mission-critical ICs lost due to the limited access to electronic nodes enabling confidence in the quality of your shipped automotive electronics.

Big Data Analytics

Combining test and measurement expertise with data science and big data engineering, the PathWave Manufacturing Analytics platform provides actionable insights for every level in your organization in the smart factory of the future. Improve yield, lower retest, and handling, and lower the cost of poor quality with big data advanced analytics that really works. Accelerate your Return on Investment and business outcomes with unique, innovative analytics.