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Highlights

Introducing the Keysight i3070 Series 7i inline test system — your path to superior test coverage and enhanced throughput.

Featuring the latest Quad-Density Pin Cards, Series 7i can accommodate up to 5760 test nodes while maintaining a slim 800mm width footprint. This increased capacity provides more resources for complex testing requirements and allows for processing larger panels while saving board handling and transfer time.

Rest easy knowing your investment is secure, as the Series 7i guarantees full backward compatibility with current E9988E and E9988EL test programs and fixtures.

  • Doubles Test Nodes: Accommodates up to 2x more test nodes while maintaining a compact footprint.
  • Integrates Supercapacitor Testing: Effortlessly tests supercapacitors up to 100 Farads (F) through an available integration solution.
  • Enables Low-Current Measurement: Achieves measurements as low as 100 nano-Amperes (nA), streamlining development time.
  • Accelerates Shorts Test: Executes Enhanced Shorts Test algorithm 50% faster compared to traditional methods.
  • Enhances Coverage: Improves coverage via automatic cluster test generation.
  • Facilitates Expansion: Offers a built-in functional port for expanding test capabilities.
  • Overcomes Access Limitations: Integrates x1149 Boundary Scan Analyzer to overcome restricted test access.

For more information about Keysight's ICT systems, please visit www.keysight.com/find/ict

Key Specifications

Download Data Sheet
Fixture Actuation
Press Down
Max Node Count
5760
Max Parallel Testing
2
System Type
Automated Handler
System Width
800mm
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Press Down
5760
2
Automated Handler
800mm
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Fixture Actuation:
Press Down
Max Node Count:
5760
Max Parallel Testing:
2
System Type:
Automated Handler
System Width:
800mm
E9988GL Front View

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Extend the Capabilities for your High-Density In-Circuit Test (ICT) System, I337x Series 7i

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Featured Resources

Application Notes 2023.11.06

i3070 In-Circuit Test System: Transitioning from 662xA to N6700 Series MPS

i3070 In-Circuit Test System: Transitioning from 662xA to N6700 Series MPS

This application note delves into the significant disparities between the Keysight 662xA and N67xx DUT power supplies, specifically in the context of the Keysight i3070 In-Circuit Test (ICT) system. It aims to facilitate the seamless migration of existing programs or the development of new ones for the N67xx series by providing in-depth technical insights. The N67xx Modular Power System offers enhanced features and capabilities, including power ratings and adjustable slew rates. Understanding these technical nuances is pivotal for a smooth transition and unlocks new possibilities for diverse applications.

2023.11.06

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

Application Notes 2023.03.20

Configuring the i3070 Settings with Autocode

Configuring the i3070 Settings with Autocode

The i3070 is a widely used Automatic Test Equipment (ATE) model for testing printed circuit boards (PCBs) in the electronics industry. The i3070 uses a Programmable Logic Controller (PLC) address and data, which is referred to as "autocode" to configure various settings and configurations, including the "dual board staging" setting. However, changing these settings during production changeover can be risky, as it requires access to maintenance mode and can result in errors if wrongly selected. This application note provides guidance on setting up auto-code in the “testplan” to improve the efficiency and accuracy of the i3070 configuration process.

2023.03.20

Application Notes 2023.01.05

Practical Bead Probe Implementation Strategy

Practical Bead Probe Implementation Strategy

This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.

2023.01.05

Application Notes 2023.01.04

Essential Steps for Practical Bead Probe Implementation

Essential Steps for Practical Bead Probe Implementation

This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact of various variables such as bead height, length, and aperture size, as well as probe force, and selecting the appropriate probe head style for different types of applications.

2023.01.04

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

View All Resources

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