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How to Perform LIV Test for VCSEL Devices

Precision Source Measure Unit
+ Precision Source Measure Unit

Performing LIV test with narrow-pulsed current output

Light-current-voltage (LIV) testing for vertical-cavity surface-emitting laser (VCSEL) devices requires precise control of the injection current (I) and light output power (L) measurement. The test process involves systematically varying the current, measuring the corresponding light output, and recording the voltage (V) applied. Test engineers can use the source / measure units (SMUs) to provide programmable current sourcing to apply a wide range of currents to the VCSEL. They also need high-speed photodetectors to capture the emitted light, measuring its power precisely. Engineers can plot these data points to create the LIV curve, which provides a detailed understanding of the VCSEL's performance characteristics under different operating conditions.

The key challenge lies in conducting tests that mitigate the impact of self-heating on the diode and ensure accurate measurement results. Temperature variations significantly influence the behavior of laser diodes. As the temperature rises, laser efficiency tends to decrease. Test engineers require a narrower pulsed output capability to suppress the self-heating effect and a high-speed sampling rate to capture the fast and extremely narrow current / voltage pulses to validate the dynamic characteristics. It is also necessary to synchronously measure the photodetector (PD) current during the pulsed light emission from the laser diode (LD). This requires precise timing control between the LD and PD within the measurement software and SMU.

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Narrow-Pulsed LIV Test Solution

Narrow-pulsed LIV test solution

Characterizing VCSEL devices requires a solution that can mitigate the impact of self-heating on the diode, ensuring accurate measurement results. The Keysight narrow-pulsed LIV test solution is a comprehensive solution that enables engineers to conduct in-depth LIV tests under diverse operating conditions, especially at ultra-low current and voltage levels. The solution offers 20 SMU channels in a compact 1U rack space. It integrates a pulser and digitizer to eliminate the need for multiple instruments and streamline the testing process significantly. The accompanying IV curve measurement software provides quick, programming-free testing execution.
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