How to Unmask Device Under Test Spurs and Noise

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Pro Analog Signal Generator
+ Pro Analog Signal Generator
Pro Analog Signal Generator
+ Pro Analog Signal Generator

See Device Under Test Artifacts more Clearly

RF component characterization uses a controlled radio frequency stimulus to evaluate low-level spurious responses, close-in noise, conversion products, and distortion artifacts from the device under test. The setup typically includes a spectrally pure signal generator, calibrated cabling or filtering, and a signal analyzer or measurement receiver to observe the output spectrum.

Configure the signal source for the required carrier frequency, output level, and spectral purity, then apply it to the device under test. Low phase noise, low residual frequency modulation, and reduced spurious content help limit source-induced artifacts, making it easier to separate device-generated responses from stimulus-related effects.

Device Under Test Spur Visibility Solution

RF component characterization requires a clean stimulus and a measurement path that can resolve low-level spectral artifacts. This solution uses a high-spectral-purity signal generator to stimulate the device under test while limiting source-related phase noise, residual frequency modulation, and spurious content. Engineers can observe close-in noise, low-level spurs, conversion products, and distortion responses from mixers, amplifiers, converters, or signal-chain elements. The setup helps separate DUT-generated artifacts from source-induced effects when small spectral differences must be measured under controlled radio frequency conditions.
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How to Unmask Device Under Test Spurs and Noise Block Diagram

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