Keysight affordable compact signal generators feature low phase noise and fast switching speeds, ideal for single- and multi-channel phase coherent RF local oscillators for radar, 5G/6G, and RF component test. Designed to support engineering workflows from early design through validation, these compact signal generators help reduce measurement uncertainty, improve correlation, and deliver repeatable results — without sacrificing bench space.
XG1 Analog Signal Generator, 6.1 GHz
The Keysight AP5001A analog signal generator covers RF frequencies from 9 kHz to 6.1 GHz, with excellent signal purity and fast switching speed.
- Harmonics @ 1 GHz -40 dBc
- Output power @1 GHz 17 dBm
- Phase noise @1 GHz (20 kHz offset)
- -130 dBc/Hz Maximum frequency 6.1 GHz
- Frequency switching speed 20 µs
- Number of outputs 1
XG1 Analog Signal Generator, 26 GHz
The Keysight AP5002A analog signal generator covers microwave frequencies from 9 kHz to 26 GHz, with excellent signal purity and fast switching speed.
- Harmonics @ 1 GHz -40 dBc
- Output power @1 GHz +23 dBm
- Phase noise @1 GHz (20 kHz offset)
- -130 dBc/Hz Maximum frequency
- 26 GHz Frequency switching speed 200 µs
- Number of outputs 1
Webinar: New Compact RF Solutions
See Keysight’s compact RF signal generators in action and learn how they support everyday source testing. Expert-led demos walk through key capabilities, practical use cases, and selection considerations, from frequency range and output power to signal purity, phase noise, and switching speed.
Validate RF with Practical Analog Source Setups
When receiver behavior, RSSI response, or amplifier performance needs to be characterized, the signal source can affect how test conditions are created and repeated. This application note reviews common RF device test setups using compact analog signal generators, including blocker and interferer testing, power calibration, LO and clock substitution, and amplifier gain, compression, and intermodulation testing. With practical setup examples and documented source specifications, you’ll see how output power range, signal purity, and switching speed apply to RF device characterization across R&D, manufacturing, and field test workflows.
