W8580BP WaferPro Express Core Measurement Bundle

The W8580BP WaferPro Express Core Measurement Bundle includes: 

• A modern and intuitive user interface to setup automated wafer measurement
• Over 50 turnkey measurement drivers
• An advanced data display, wafer data mapping viewer and SQL database
• Support for Cascade Microtech wafer probers

The W8580BP Waferpro Express Core Measurement Bundle includes all the necessary capabilities to perform automated DC, CV and RF on-wafer measurements. The table below illustrates the key feature components included with the bundle. The bundle includes the user interface environment, including the wafer map environment, the data display, and the SQL Database. All the instrument drivers and their capabilities are included. Drivers for Cascade Microtech probers are also included. Please refer to the WaferPro Express brochure for details about supported instruments, wafer probers, thermal chucks and switch matrixes.

Measured data are either saved to ASCII format or to SQL Database. Both of these formats are fully compatible with Keysight Device Modeling products Integrated Circuit Characterization & Analysis Program (IC-CAP), Model Builder Program (MBP) and Model Quality Analysis (MQA).

The turnkey measurement routines cover typical DC, CV and RF tests for most standard devices such as MOSFET, BJT, FET, and DIODE devices. New test routines can be created and saved in the library via the user interface (UI), however, the customization of routines via the programming environment is not allowed with this bundle. Routines containing programs created with the most advanced W8581BP WaferPro Express Core Measurement and Programming Bundle will run seamlessly in this environment; so if you have multiple test stations, you can use the W8580BP WaferPro Express Core Measurement Bundle in most test stations and add one or two copies of the advanced bundle to create and test your measurement library. If you have only one test station, we recommend purchasing the W8581BP WaferPro Express Core Measurement and Programming Bundle, which provides more flexibility and a higher level of customization.

DC Measurements test systems such as those including the B1500A Semiconductor Device Parameter Analyzer (Characterization System) Mainframe/EasyEXPERT and the B2200A fA Leakage Switch Mainframe are fully supported by this bundle; however, depending on the special configuration of the switch matrix connection, the W8581BP WaferPro Express Core and Programming Bundle may be necessary to customize the switch matrix driver. Please discuss this with your Keysight application expert. The Keysight 4070/4080 Parametric Test Systems are not supported in WaferPro Express, please see the W8510EP IC-CAP Wafer Professional if you need to control these systems.

Support for non-Cascade Microtech probers can be enabled by purchasing the W8585EP Add-on product.
 

Note: The model numbers on this page reflect node-locked perpetual licenses (BP/EP suffix). Subscription or Time-based (BT/ET suffix) and Floating license configurations are also available.

Learn more about WaferPro Express.