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X-Series Measurement Applications

Phase Noise Measurement Application, Multi-touch UI

This bundle is part of PathWave X-Series Measurement Applications

Installs on: Instrument


Key Features

  • 30-Day Free Trial for X-Series Measurement Applications
  • Provide one-button measurements for analyzing phase noise in frequency domain (log plot) and time domain (spot frequency)
  • Log plot measurements: provides phase noise view in frequency domain including DANL floor and integrated noise measurements along with spurious table
  • Spot frequency measurements: provides phase noise view in time domain including carrier frequency drift measurement
  • Monitor spectrum: provides easy-to-use simple spectrum view for a quick check of your signal
  • IQ waveform measurements: provide easy-to-use simple time domain view
  • Performance:
    - Phase noise density accuracy: up to ±0.20 dB
    - Offset frequency accuracy: ±0.5 %
    - Base instrument phase noise (typical with center frequency = 1 GHz) -128 dBc/Hz
  • Support multi-touch user interface and SCPI remote interface programming
  • KeysightCare software support subscription included

This Bundle Includes

  • N9068EM0E X-Series measurement application license for phase noise measurements with multi-touch UI
  • Phase noise measurement application software subscription and support (12-month)

 

System Requirements

Instrument Compatibility

This Bundle Is Part of…

PathWave X-Series Measurement Applications — The industry's broadest offering of measurement applications for benchtop and modular signal analyzers for cellular communications, wireless connectivity, aerospace/defense, and general purpose.


Learn more: PathWave X-Series Measurement Applications

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US$ 2,539