The W8550 IC-CAP PSP Model Extraction Package provides complete measurement and extraction procedures for DC, CV, and RF model parameters. The intuitive, Windows-style user interface enables engineers to quickly produce an accurate model.
PSP, a CMC industry-standard model advanced surface potential model, was jointly developed by Arizona State University and NXP Semiconductors. Earlier compact models, such as the BSIM4, were primarily developed for digital circuits and have limitations when used for analog and RF applications at smaller technology nodes. The PSP model calculates the device’s surface potential, enabling a more accurate description of the deep sub-micron physical phenomena and resulting in a more accurate description of the internal currents and charges.
DC, CV and RF extraction for PSP v103.1 with methods for modeling high-frequency effects for MOS/CMOS
Robust, direct extraction procedures used to find best initial values for optimizers thereby removing the need for excessive optimization and tuning steps
Flexible, customizable extraction flow
Windows-style data visualization, optimization and tuning
Shared user interface environment with extraction package products available for other industry standard models including BSIM3, BSIM4, BSIMSOI4, HiSIM2 and HiSIM_HV. The common measurement module enables you to use measurements to extract any of these models