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W7021E PathWave IC-CAP PSP Model Extraction Package
PathWave IC-CAP PSP Model Extraction Package
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The W7021E PathWave IC-CAP PSP Model Extraction Package provides measurement and extraction procedures for PSP, a CMC industry-standard model advanced surface potential model for MOSFET devices.
Highlights
The W7021E PathWave IC-CAP PSP Model Extraction Package includes:
- DC, CV, and RF extraction for the latest PSP version, including high-frequency effects
- Robust, direct extraction procedures find the best initial values for optimizers, thereby removing the need for excessive optimization and tuning steps
- Flexible, customizable extraction flow
- Windows-style data visualization, optimization, and tuning
- Shared user interface environment with other extraction CMOS extraction products
- Target and Corner Modeling
PSP, a CMC industry-standard advanced surface potential model, was jointly developed by Arizona State University and NXP Semiconductors. The PSP model calculates the device’s surface potential, enabling a more accurate description of the deep sub-micron physical phenomena and, in turn, of the internal currents and charges.
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