How to Perform Network Parameter Measurements in ICT

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In-Circuit Test Systems
+ In-Circuit Test Systems
In-Circuit Test Systems
+ In-Circuit Test Systems

Connector Network Parameter Testing

Network parameter measurement in in-circuit test (ICT) systems involves evaluating the electrical characteristics of connectors to detect faults such as opens on power and ground pins. The test setup includes an ICT system equipped with Vectorless Test Enhanced Probe (VTEP) hardware, sensor plates, and connector models that define expected electrical behavior. Accurate measurement requires careful fixture design, including proper sensor plate alignment, sizing, and mounting to ensure reliable coupling with the device under test.

The measurement workflow begins with standard signal pin validation, followed by network parameter measurement on power and ground pins using predefined connector models. Guarding techniques are applied to minimize leakage paths and improve measurement accuracy. The system compares measured responses against expected network parameters to identify deviations caused by faults. Debug processes such as auto debug and controlled fault insertion are used to validate test coverage and optimize measurement performance.

Network Parameter Measurement ICT Solution

Network parameter measurement requires precise fixture design, proper guarding, and accurate modeling of connector behavior to detect faults in complex interconnect structures. This solution uses an ICT system with vectorless test capabilities to measure electrical characteristics of connectors and identify open conditions on power and ground pins.

The system incorporates sensor plates, enhanced guarding features, and connector models to improve measurement sensitivity and reduce noise. Enhanced guarding reduces impedance in the measurement path, improving accuracy when testing devices with complex grounding structures. The solution supports a wide range of connector types, including Peripheral Component Interconnect (PCI) Express, Double Data Rate (DDR), and Serial Advanced Technology Attachment (SATA), and enables reliable detection of faults that are difficult to identify using traditional test methods. Integrated debugging tools such as auto debug and known good board validation further improve test robustness and coverage.

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