How to Validate Device Response to Pulse Faults

+ Pulse Generator

Inject Pulse Fault Conditions

Pulse fault validation becomes difficult when a device only fails after missing, delayed, narrowed, widened, or distorted pulses. These failures may occur intermittently, depend on pulse sequence history, or appear only after specific timing and edge conditions are present at the device input.

The challenge is determining whether the failure is caused by pulse placement, width, amplitude, edge shape, spacing, or the device response to an abnormal pulse event. When the upstream signal source cannot reproduce those fault conditions consistently, engineers may not be able to isolate the condition that triggers the failure.

Pulse Fault Injection Solution

Pulse fault validation requires applying a known pulse sequence and then intentionally removing, delaying, narrowing, widening, or distorting selected pulses. A Keysight pulse generator with timing, level, edge, pattern, and function arbitrary capabilities provides controlled stimulus for reproducing missing and distorted pulse conditions at the device input. Engineers can configure pulse placement, width, delay, amplitude, edge behavior, and repetition sequence while observing downstream response. The setup supports functional debug when device behavior depends on abnormal pulse events rather than a stable continuous pulse train.

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