How to Evaluate Electromagnetic Leakage in Secure Chips

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Side Channel Analysis
+ Side Channel Analysis
Side Channel Analysis
+ Side Channel Analysis

Pinpoint EM Leakage Hotspots

Electromagnetic leakage evaluation requires scanning near-field emissions while a secure chip executes controlled cryptographic operations under repeatable timing and trigger conditions. The workflow combines device control, triggering, probe positioning, signal capture, and analysis so evaluators can observe where and when information-bearing emissions appear across the chip or package during active processing.

Engineers typically review the measured behavior across multiple acquisitions, compare activity under different operating conditions, and isolate spatial or spectral regions that correlate with sensitive operations. The resulting data helps distinguish general switching noise from leakage hotspots and supports implementation review, shielding assessment, and countermeasure tuning for security-critical silicon.

Secure Chip EM Leakage Solution

Electromagnetic leakage evaluation requires controlled execution of a secure device while near-field emissions are captured, correlated, and reviewed for patterns linked to sensitive processing. Keysight’s Side Channel Analysis solution helps engineers evaluate embedded devices, chips, and smart cards through acquisition, triggering, alignment, signal processing, and cryptanalytic analysis using power and electromagnetic emissions. The workflow reflects common side-channel attack patterns and secure programming practices, supporting engineers who need to locate leakage hotspots, compare implementation behavior, and reduce observable leakage in security-critical chip designs.
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Evaluate Electromagnetic Leakage in Secure Chips

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