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Measurement probes are a foundational component of side-channel analysis, enabling security engineers to capture power consumption and electromagnetic emissions generated by a device during operation. These physical signals can contain information that correlates with internal computations, making them valuable for identifying leakage that could reveal sensitive data or expose weaknesses in cryptographic implementations.
Used throughout the security evaluation process, measurement probes help researchers and development teams investigate potential vulnerabilities, validate the effectiveness of implemented countermeasures, and assess the resilience of embedded devices against side-channel attacks. By providing visibility into a device's real-world behavior, they enable a deeper understanding of how hardware and software interact during security-critical operations.
Supporting both power analysis and electromagnetic analysis methodologies, measurement probes are commonly used to evaluate secure elements, smart cards, microcontrollers, FPGAs, system-on-chip (SoC) devices, and other embedded technologies. Whether used for vulnerability research, certification preparation, product development, or security testing, high-quality signal acquisition forms the foundation for accurate and repeatable side-channel analysis.
Measure subtle variations in device power consumption to identify leakage and support power analysis evaluations.
Acquire low-amplitude signals with the sensitivity and precision required for accurate and repeatable side-channel analysis.
DS1203B
The DS1203B High Precision Electromagnetic Probe, a highly precise probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits.
The High Precision Electromagnetic Probe, a highly sensitive probe used in side channel analysis, picks up electromagnetic emissions from semiconductor circuits. The probe has a mechanism that allows you to swap out three different probe tips of varying sizes: 0.2 mm, 0.5 mm, and 1.25 mm. All tips have a directed coil and a protective Teflon shell. Normally used in combination with an XYZ-motion platform, the probe can pick up electromagnetic fields with frequencies of up to 6 GHz, converting them into an AC signal.
By moving over the surface of a target, the DS1203B can find highly active circuits, or hotspots. The signals picked up on a hotspot comprise the measurements for simple or differential electromagnetic analysis. The High Precision Electromagnetic Probe has a variable gain mechanism, which you can set by hand or through an external device and can vary based on the target’s characteristics.
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DS1201A
The DS1201A Passive Current Probe measures the power consumption of embedded devices, such as system-on-chip devices and FPGAs, during side channel analysis.
Measuring the power consumption of embedded technology to perform side channel analysis adds specific challenges to the measurement setup. Power lines on embedded devices are generally noisier, signals travel at a higher speed, and form factors are highly variable as compared to for example smart cards. Take on the challenge of performing side channel analysis on embedded devices, such as system-on-chip (SoC) devices and field programmable gate arrays (FPGA), with our DS1201A Passive Current Probe.
DS1202A
The DS1202A Active Current Probe is a highly sensitive probe that detects electrical currents, measuring a target device’s power consumption.
The Active Current Probe is a high-frequency probe that actively picks up electrical currents. Used in side channel analysis to measure a target device’s power consumption, the highly sensitive DS1202A is inserted in the power supply line of a target and can transfer current variations of up to 2 GHz. The Active Current Probe is used in combination with a base unit, which can be used to amplify the measured signal.
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Measurement probes capture the physical signals produced by a device during operation, such as power consumption and electromagnetic emissions. These signals can contain information correlated with internal computations and cryptographic operations, helping engineers identify potential side-channel leakage.
Side-channel evaluations often rely on detecting very small variations in power consumption or electromagnetic emissions. High-quality signal acquisition helps improve measurement accuracy, reduce noise, and increase confidence in security evaluation results.
Current probes are typically used when performing power analysis evaluations. By measuring current consumption, they enable engineers to capture power traces that can be analyzed for side-channel leakage and cryptographic vulnerabilities.
The best probe depends on your target device, evaluation objectives, and testing methodology. Some applications are better suited for power analysis using current probes, while others may benefit from electromagnetic analysis. We recommend discussing your requirements with the Keysight Device Security team to identify the most appropriate solution for your use case and testing environment.
Side-channel leakage refers to information unintentionally revealed through physical effects such as power consumption, electromagnetic emissions, timing behavior, or other observable characteristics of a device during operation.
Power analysis measures variations in a device's power consumption to identify potential information leakage. Electromagnetic (EM) analysis measures electromagnetic emissions generated by device activity, allowing engineers to investigate localized behavior within specific areas of a circuit.
It's inserted directly into the target's power supply line, so it sits between the power source and the device to capture current variations in real time.
The measurement probes can be used to evaluate a wide range of embedded devices, including:
Yes. Measurement probes are commonly used by evaluation laboratories, certification facilities, semiconductor companies, and product security teams to perform side-channel assessments and validate security requirements.
Yes. Because side-channel leakage signals are often small and difficult to observe, specialized measurement probes and acquisition hardware are typically required to obtain accurate and repeatable results.