DS1203B

Capture Side-Channel Signals with Precision

Measurement probes are a foundational component of side-channel analysis, enabling security engineers to capture power consumption and electromagnetic emissions generated by a device during operation. These physical signals can contain information that correlates with internal computations, making them valuable for identifying leakage that could reveal sensitive data or expose weaknesses in cryptographic implementations.

Used throughout the security evaluation process, measurement probes help researchers and development teams investigate potential vulnerabilities, validate the effectiveness of implemented countermeasures, and assess the resilience of embedded devices against side-channel attacks. By providing visibility into a device's real-world behavior, they enable a deeper understanding of how hardware and software interact during security-critical operations.

Supporting both power analysis and electromagnetic analysis methodologies, measurement probes are commonly used to evaluate secure elements, smart cards, microcontrollers, FPGAs, system-on-chip (SoC) devices, and other embedded technologies. Whether used for vulnerability research, certification preparation, product development, or security testing, high-quality signal acquisition forms the foundation for accurate and repeatable side-channel analysis.

Capture Power Leakage

Measure subtle variations in device power consumption to identify leakage and support power analysis evaluations.

Detect Electromagnetic Activity

Capture localized electromagnetic emissions from semiconductor circuits to locate hotspots and uncover security-relevant behavior.

Evaluate Modern Embedded Devices

Support security testing across a wide range of targets, including secure elements, microcontrollers, SoCs, FPGAs, and smart cards.

Enable High-Quality Signal Acquisition

Acquire low-amplitude signals with the sensitivity and precision required for accurate and repeatable side-channel analysis.

Frequently Asked Questions