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Parametric Test Solutions Wafer-level test systems for parametric validation
Model: N9100A
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4080 Series Parametric Test Systems
The 4080 Series parametric test systems are the industry-standard full parametric test system offering a wide range of measurement capabilities.
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Maximum number of measurement pins
48
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Minimum voltage measurement resolution
2 µV
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Additional features
SPGU output
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Minimum current measurement resolution
1 fA
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Highlights
4080 Series: Parametric Test System Total Solution
Keysight 4080 Series offers a wide range of measurement capabilities required for the fundamental parametric tests. You can easily perform DC and capacitance measurements such as Vth, Ids, Idoff, and Cox, to name just a few. 4080 Series supports three types of SMU (Source Monitor Unit) for DC measurement. Several other instrument options, such as a digital voltmeter(DVM), a spectrum analyzer, and an LCD meter, provide enhanced measurement capabilities.
- Industry-standard Parametric Test System with SPECS and 4070 Series compatibility
- Increase throughput up to 50% with asynchronous and synchronous parallel test capability
- More flexible configurations: standard low-current and ultra low-current (12 to 48 pins)
- Facilitate test automation with SEMI standards
- Lower cost with Linux OS
- Totally integrated parametric test solution with service and support
Services and support
Innovate at speed with curated support plans and prioritized response and turn-around times.
Get predictable, lease-based subscriptions and full lifecycle management solutions—so you reach your business goals faster.
Experience elevated service as a KeysightCare subscriber to get committed technical response and more.
Ensure your test system performs to specification and meets local and global standards.
Make measurements quickly with in-house, instructor-led training, and eLearning.
Download Keysight software or update your software to the newest version.
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