Device Modeling WaferPro

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Highlights

Device Modeling WaferPro software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for various instruments and wafer probers. Its new user interface makes setting up and running complex wafer-level test plans easy, while the latest Python 3 programming environment enables powerful customization capabilities.

Device Modeling WaferPro includes:

Turnkey test algorithms and instrument drivers that reduce the software learning curve and accelerate the process of setting up your measurement system and performing your first measurement.
Support for various prober’s manufacturers, including FormFactor Inc., MPI Corporation, and others.
A modern and intuitive user interface which quickly enables you to connect to instruments and define a test plan.
Exclusive integration with FormFactor’s latest control software, Velox 3. The WaferSync interface between Device Modeling WaferPro and Velox enables complete wafer map synchronization and automated monitoring of the RF calibration during test plan execution.
Advanced tools such as Data Display Wafer Mapping Data Viewer increase productivity when efficiently handling high-volume data. In addition, the Python / PEL programming environment enables you to customize test algorithms and measured data analysis.

Device Modeling WaferPro is also the software platform for Keysight's Advanced Low-Frequency Noise Analyzer (A-LFNA), a high-performance noise analyzer for making accurate and repeatable low-frequency noise measurements.

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Integrated Measurement Systems

Device Modeling WaferPro is a software component of Integrated Measurement Systems (IMS), a joint partnership program by Keysight Technologies and FormFactor. IMS products drastically reduce the time to first measurement and provide accurate and repeatable device and component characterization.

Integrated Measurement System IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
Integrated Measurement System IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements
Integrated Measurement System IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz

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W7501B

W7501B PathWave WaferPro Measurement and Programming

スタート価格:

Run automated wafer-level measurements with turnkey instrument drivers and routines. Create Python 3 and PEL programs to execute custom measurement algorithms.

W7801B

W7801B PathWave WaferPro WGFMU 測定

スタート価格:

Execute automated wafer-level low-frequency noise measurement with turnkey measurement drivers and measurement routines for WGFMU.

W7802B

W7802B PathWave WaferPro A-LFNA 測定およびプログラミング

スタート価格:

Execute automated wafer-level low-frequency noise measurements with turnkey measurement drivers and measurement routines for both A-LFNA and WGFMU.