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HIGHLIGHTS

Provides the best return on parametric test investment for all evolving semiconductor manufacturers by meeting all test demands from Keysight 4080 Series serial parametric test to P9001A per-pin parallel parametric test and everything in between.
  • The flexible and configurable parametric test solution lets you build your own parametric tester from serial to parallel.
  • Get innovative high throughput with a "true" per-pin parametric test platform using Keysight's unique technologies embedded in the flagship P9001A.
  • The flexible option structure gives you the best balance of test throughput and budget.
  • Upgrade the parametric tester with additional channels and optional test functions whenever new test needs occur.
  • Get good data correlation with the Keysight 4080 Series.
  • Easily develop a parallel test plan.
  • Easily migrate from a 4080 environment.

What's included:

  • cabinet
  • test head
  • system controller

Key Specifications

Download Technical Specification
Maximum Number of SPGU output channels
4 channels
Maximum Number of Measurement Pins
100
Minimum Current Measurement Resolution
0.1 fA
Minimum Voltage Measurement Resolution
2 µV
Parallel Parametric Test Capability
Yes
Maximum Number of SPGU output channels
Maximum Number of Measurement Pins
Minimum Current Measurement Resolution
Minimum Voltage Measurement Resolution
Parallel Parametric Test Capability
4 channels
100
0.1 fA
2 µV
Yes
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Additional Features:
SPGU output
CV measurement
Form Factor:
Complete Test System
Maximum Number of Measurement Pins:
100
Maximum Number of SPGU output channels:
4 channels
Minimum Current Measurement Resolution:
0.1 fA
Minimum Voltage Measurement Resolution:
2 µV
Parallel Parametric Test Capability:
Yes
Type:
Parametric Test Solution
Parametric Test System Keysight

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