Parallel Parametric Test System

P9002A parallel parametric test system is an addition to Keysight P9000 Series parallel parametric tester with flexible license-based configuration.

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  • Maximum number of measurement pins

    100

  • Minimum voltage measurement resolution

    2 µV

  • Additional features

    SPGU output, CV measurement

  • Minimum current measurement resolution

    0.1 fA

Ready for a quote

Find out what's included and explore available upgrade options from Keysight.

Highlights

Provides the best return on parametric test investment for all evolving semiconductor manufacturers by meeting all test demands from Keysight 4080 Series serial parametric test to P9001A per-pin parallel parametric test and everything in between.
  • The flexible and configurable parametric test solution lets you build your own parametric tester from serial to parallel.
  • Get innovative high throughput with a "true" per-pin parametric test platform using Keysight's unique technologies embedded in the flagship P9001A.
  • The flexible option structure gives you the best balance of test throughput and budget.
  • Upgrade the parametric tester with additional channels and optional test functions whenever new test needs occur.
  • Get good data correlation with the Keysight 4080 Series.
  • Easily develop a parallel test plan.
  • Easily migrate from a 4080 environment.

What's included:

  • cabinet
  • test head
  • system controller