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3D Interconnect Designer
3D Interconnect Designer provides a flexible modeling and optimization environment for any advanced interconnect structure, including chiplets, stacked die, packages, and PCBs.
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Save up to 50% on an XR8 Oscilloscope
Get faster digital validation for less with a trade-in.
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Discover Keysight AI Data Center Builder
Emulate every part of your data center infrastructure. Emulate Anything. Optimize Everything.
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Accelerate Signal Analysis with X-Series Measurement Applications
Use 25+ X-Series applications to analyze, demodulate, and troubleshoot signals across wireless, aerospace/defense, EMI, and phase noise.
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Introducing AI-Enhanced Packet Brokers
With extra memory and storage, these enhanced NPBs run Keysight's AI security and performance monitoring software and AI stack.
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Precision In-Circuit Testing for Production
Achieve fast, accurate board-level testing with robust inline and offline ICT designed for modern manufacturing.
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Accelerate Your Innovation Engine
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448 Gb/s Waveform Generation
Achieve 200+ Gbaud multi-level modulated signals with high-speed AWGs for digital and optical standards.
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Stream 120 MHz I/Q Data to Your Laptop in the FieldPinpoint interference with post-processing spectrum management software in the lab.
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Accessories
Explore the complete portfolio of Keysight accessories designed to complement and extend your instruments. Use the filters below to quickly find compatible accessories such as modules, cables, adapters, and other system components to configure, expand, and optimize your test system for your specific measurement needs.
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InfiniiMax Ultra Probe Amplifier, 25 GHz
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
InfiniiMax Ultra Probe Amplifier, 25 GHz
MX0025A
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
- Test and validate high-speed technologies such as DDR5 / MIPI with the 25 GHz probe amplifier (AP2).
- Experience the highest input impedance in midband frequencies for low-energy probing.
- Boost test margins with the lowest signal degradation.
- Probe small devices with the super-flexible micro probe head or choose from the widest variety of compatible probe heads for your unique application.
- Measure differential, single-ended, and common mode signals with a single probe tip.
- Use with Infiniium UXR-, 90000 X-, Q-, V-, and Z-Series oscilloscopes.
Keysight’s MX0025A InfiniiMax Ultra Series probe amplifier improves usability because you can measure differential, single-ended, and common mode signals with a single probe tip.
When you use a probe to connect your signal to your oscilloscope, it becomes part of the circuit affecting your test. Your probe may be hiding signal details, loading down your signal, or distorting it. InfiniiMax Ultra Series probes have the lowest loading for minimal impact to your circuit. Boost your test margins and gain measurement confidence with their unprecedented accuracy. Ensure your entire measurement system is helping you see the truest representation of your signal.
These probes have the lowest noise and capacitive loading and the lowest loading across more frequencies due to their RC high impedance profile. The InfiniiMax Ultra Series supports InfiniiMode and has a user-defined AC calibration mode, a wider input voltage range, more accuracy with unique S-parameter characterization, lower capacitive loading, a wider input voltage range, micro / socketed probe heads for smaller density probing, and more bandwidths. The InfiniiMax Ultra Series has an RC input impedance architecture with the lowest loading and least signal distortion across the widest frequency range.
InfiniiMax Ultra probes have three attenuation ranges — 1:1, 4:1, and 8:1 — giving you superior noise performance and large voltage ranges, all while maintaining maximum bandwidth. The input range automatically configures depending on the size of the input signal and vertical scale of your oscilloscope.
Choose from the three flexible input dynamic ranges from 600 mVpp at 1:1, 2.5 Vpp at 4:1, and 5 Vpp at 8:1. Clearly see and know when your design is satisfactory, keep up with standards, easily probe small devices, and reduce test complexity with the InfiniiMax Ultra Series probes.
GSS6450 Record and Playback System
The GSS6450 captures real-world GNSS, cellular, and wideband RF signals across three independent ports for high-fidelity, repeatable playback in the lab.
The GSS6450 captures real-world GNSS, cellular, and wideband RF signals across three independent ports for high-fidelity, repeatable playback in the lab.
GSS6450 Record and Playback System
PNT6450A
The GSS6450 captures real-world GNSS, cellular, and wideband RF signals across three independent ports for high-fidelity, repeatable playback in the lab.
- Record across three independent RF ports covering GNSS L1/L2/L5/B3/E6, Wi-Fi, and LTE/cellular bands
- Maintain high frequency stability during record and playback using an oven-controlled oscillator
- Play back legacy recordings for regression and comparison testing
- Connect two High Speed CAN and CAN FD interfaces for automotive development workflows
- Import user-defined antenna patterns and vehicle dynamics data
- Reconfigure between runs using feature key licensing and field-upgradeable options
- Control the unit via touchscreen, Wi-Fi, web server, or scripted automation
- Deploy at 2.2 kg with a compact form factor for portable field collection
Landslide C50
The Keysight Landslide C50 is a mobile packet core test system for functional, scale, and performance testing of O-RAN, 5G, LTE, Wi-Fi, IMS, and Diameter networks.
The Keysight Landslide C50 is a mobile packet core test system for functional, scale, and performance testing of O-RAN, 5G, LTE, Wi-Fi, IMS, and Diameter networks.
Landslide C50
LN2C50A056
The Keysight Landslide C50 is a mobile packet core test system for functional, scale, and performance testing of O-RAN, 5G, LTE, Wi-Fi, IMS, and Diameter networks.
The Landslide C50 delivers mobile packet core testing in a compact 3U appliance that combines test manager and test server functions in a single system.
- Supports O-RAN, 5G, LTE, 3G, Wi-Fi, IMS, and Diameter network testing
- Emulates tens of thousands of UEs with gigabytes of traffic throughput
- Combines test manager and test server in one appliance for simplified deployment
- Optional add-on test server (L-C50-S5-TS) for end-to-end testing and moderate-capacity scenarios
- Interface options from 1 GbE to 100 GbE — including fiber, copper, SFP+, SFP28, QSFP+, and QSFP28+
- Full command mode sequencer for busy-hour call modeling
- TCL and RESTfulAPI automation interfaces for reproducible test execution
- Test scripts portable to higher-scale Landslide C100 platforms
- Hardware-accelerated IPsec processing available via optional security adaptor
- Emulates 3G/4G/5G network functions including gNB, AMF, SMF, UPF, MME, SGW, PGW, and more
Charge-Discharge Chassis for 208 VAC 3-phase
The BT2203B is part of the BT2200 Series cell formation and lifetime cycler solution. It is an 8-slot mainframe for 208 VAC 3-phase power.
The BT2203B is part of the BT2200 Series cell formation and lifetime cycler solution. It is an 8-slot mainframe for 208 VAC 3-phase power.
Charge-Discharge Chassis for 208 VAC 3-phase
BT2203B
The BT2203B is part of the BT2200 Series cell formation and lifetime cycler solution. It is an 8-slot mainframe for 208 VAC 3-phase power.
Chassis
- 208 or 200 VAC 3-phase input power
- Holds up to eight BT2204B or BT2205A modules
Channel rating per module
- BT2204B 32 channels with 6 V, ±6.25 A, 27.34 W
- BT2205A 2 channels with 6 V, ±100 A, 437.5 W
Create unique sequences
- Combine charge, discharge, pre-charge, rest state, or a DC internal resistance (DCIR) measurement steps into a test sequence.
Monitor test conditions
- Monitor voltage, Current, Power, Amp*Hours, Watt*Hours, ΔV/Δt, ΔI/Δt, ΔV, ΔI during steps.
Safety and cell protection
- Probe-check assures good connections to your cells. Customize or use predefined limits to stop charge and discharging.
The BT2200 charge-discharge platform is cost-effective and easily configurable for Li-Ion cell formation and lifetime cell cycling. Modular configurations support cells requiring maximum currents ranging from ± 6 A to ± 800 A, with up to 256 cells or channels per chassis.
Charge-Discharge Chassis for 400 VAC 3-phase
The Keysight BT2202A is an 8-slot mainframe for 400 VAC 3-phase power. It is part of the BT2200 Series cell formation cycler and formation solution.
The Keysight BT2202A is an 8-slot mainframe for 400 VAC 3-phase power. It is part of the BT2200 Series cell formation cycler and formation solution.
Charge-Discharge Chassis for 400 VAC 3-phase
BT2202A
The Keysight BT2202A is an 8-slot mainframe for 400 VAC 3-phase power. It is part of the BT2200 Series cell formation cycler and formation solution.
Chassis
- 400 or 480 VAC 3-phase input power
- Holds up to eight BT2204B or BT2205A modules
Channel rating per module
- BT2204B 32 channels with 6 V, ±6.25 A, 27.34 W
- BT2205A 2 channels with 6 V, ±100 A, 437.5 W
Create unique sequences
- Combine charge, discharge, pre-charge, rest state, or a DC internal resistance (DCIR) measurement steps into a test sequence.
Monitor test conditions
- Monitor voltage, Current, Power, Amp*Hours, Watt*Hours, ΔV/Δt, ΔI/Δt, ΔV, ΔI during steps.
Safety and cell protection
- Probe-check assures good connections to your cells. Customize or use predefined limits to stop charge and discharging.
The BT2200 charge-discharge platform is cost-effective and easily configurable for Li-Ion cell formation and lifetime cell cycling. Modular configurations support cells requiring maximum currents ranging from ± 6 A to ± 800 A, with up to 256 cells or channels per chassis.
Landslide C100-M6
The C100-M6 test server performs control and data plane load generation and analysis, plus emulation of adjacent nodes surrounding the network under test.
The C100-M6 test server performs control and data plane load generation and analysis, plus emulation of adjacent nodes surrounding the network under test.
Landslide C100-M6
LNC100M6AP
The C100-M6 test server performs control and data plane load generation and analysis, plus emulation of adjacent nodes surrounding the network under test.
- 30%–40% faster performance than the previous-generation Landslide test server
- Supports PCIe Gen 5 across five x16 expansion slots plus two OCP 3.0 mezzanine slotsEnables high-throughput test traffic generation and analysis up to 1 Tbps
- Up to four 400G or up to six 100G interface modules per test server Optional hardware-accelerated IPSec and TLS processing
- Tests and emulates nodes across mobile core, O-RAN, carrier, Wi-Fi, IMS, and Diameter networks
- Full 2G/3G, 4G, 4.5G, and 5G coverage including NSA and SA architectures
- Scales up to 32 physical or virtual test servers per Landslide Manager
- Controllable via web browser, Tcl API, or RESTful API
- Supports up to 48 simultaneous users per Landslide Manager
Octobox Pal-7
The Octobox Pal-7 is a test instrument with 4x4 MIMO OTA, tri-band radios, Synchrosniffer packet capture, and up to 320 vSTAs for AP and station testing.
The Octobox Pal-7 is a test instrument with 4x4 MIMO OTA, tri-band radios, Synchrosniffer packet capture, and up to 320 vSTAs for AP and station testing.
Octobox Pal-7
OB1018A
The Octobox Pal-7 is a test instrument with 4x4 MIMO OTA, tri-band radios, Synchrosniffer packet capture, and up to 320 vSTAs for AP and station testing.
The Keysight Octobox Pal-7 delivers automated Wi-Fi 7 (802.11be) performance testing across the 2.4, 5, and 6 GHz bands using the Qualcomm QCN9274 chipset with up to 4x4 multiple-input multiple-output (MIMO) over-the-air (OTA) transmission.
Key specs
- Four 802.11be radios supporting channel bandwidths up to 320 MHz on 6 GHz
- Up to 320 virtual stations (vSTAs) per Pal-7 (4 × 80 single-radio) or 80 multi-link operation (MLO) capable vSTAs
- 28 dBm transmit (TX) power; −97 dBm receive (RX) sensitivity
- Three 10 GbE ports — two for traffic, one for management and streaming captures
Testing capabilities
- Operates as a station (STA), access point (AP), or monitor for flexible test configurations
- Tests orthogonal frequency-division multiple access (OFDMA) and multi-user MIMO (MU-MIMO) simultaneously
- Supports fixed modulation coding scheme (MCS), bandwidth, and spatial stream settings for rate adaptation debugging
- Real-time physical layer monitoring of received signal strength indicator (RSSI), data rate, MCS, number of spatial streams (Nss), and channel width
Analysis and integration
- Synchrosniffer captures packets in PCAP format to Wireshark in real time, synchronized via Precision Time Protocol (PTP)
- Inline and monitor-mode sniffer probes for analyzing band steering, roaming, and mesh behavior
- Multiperf traffic tool supports multipoint-to-multipoint traffic with automatic recovery from disconnections
- REST API for test automation
- Available in open form factor (OB-PAL-7-Open) for walk-in chambers or open-air environments, or as a subsystem (OBS-67) built into Smartbox chambers
Semi-Anechoic Chamber
Small semi-anechoic chamber with RF isolation, filtered data connections, and built-in turntable for OTA wireless device testing.
Small semi-anechoic chamber with RF isolation, filtered data connections, and built-in turntable for OTA wireless device testing.
Semi-Anechoic Chamber
OB1BOX18A
Small semi-anechoic chamber with RF isolation, filtered data connections, and built-in turntable for OTA wireless device testing.
The Octobox Small Semi-Anechoic Chamber provides complete radio frequency (RF) isolation for over-the-air (OTA) wireless device testing, using absorber foam surfaces and high-rejection filters to prevent external interference from breaching the test environment.
Chamber performance
- 90 dB isolation (>70 dB for DC filter); no Wi-Fi traffic detected up to 7 GHz at close range
- 20 dB absorption from 1.3 to 40 GHz; >15 dB absorption down to 600 MHz
- Supports 600 MHz – 7.2 GHz operating frequency range
- Two sizes available: Box-18 (18.4" × 18.4" × 30.9") and Box-38 (24" × 38.35" × 31.2")
Connectivity and filtering
- Filtered gigabit Ethernet with power over Ethernet (PoE), USB, HDMI, and DC power connections
- 20 SubMiniature version A (SMA) RF barrel connectors plus 1 F-connector and 1 trigger SMA connector
- Waveguide port for fiber optic or non-metallic cable feeds
- Peel-and-stick replaceable gasketing for long-term isolation maintenance
Built-in turntable (BOX-38-TT)
- Software-controllable device under test (DUT) rotation, 0 – 10 rpm
- ±1° angular positioning accuracy
- Up to 10 kg payload capacity
- Ethernet and USB control interfaces; automates multiple-input multiple-output (MIMO) throughput measurements vs. orientation and range
Applications
- Wi-Fi (802.11a/b/g/n/ac/ax/be), Bluetooth, and cellular (GSM, UMTS, LTE, FDD, TD-LTE, LTE-Advanced) testing
- Antenna pattern measurement and RX dynamic range testing
- Throughput vs. range vs. orientation measurements
- Certification testing
Octobox STApal-7
Wi-Fi 7 traffic endpoint and Synchrosniffer probe with 802.11be radios on 2.4, 5, and 6 GHz for OFDMA, MU-MIMO, and analysis in Octobox testbeds.
Wi-Fi 7 traffic endpoint and Synchrosniffer probe with 802.11be radios on 2.4, 5, and 6 GHz for OFDMA, MU-MIMO, and analysis in Octobox testbeds.
Octobox STApal-7
OB1SB6EA
Wi-Fi 7 traffic endpoint and Synchrosniffer probe with 802.11be radios on 2.4, 5, and 6 GHz for OFDMA, MU-MIMO, and analysis in Octobox testbeds.
The Octobox STApal-7 serves as a Wi-Fi 7 traffic endpoint or Synchrosniffer probe for performance testing and expert analysis of Wi-Fi devices and systems in Octobox personal testbeds.
- Four 802.11be radios covering 2.4, 5, and 6 GHz bands with up to 2x2 multiple input multiple output over the air (MIMO-OTA) transmission
- Up to 16 orthogonal frequency division multiple access (OFDMA) stations and 256 virtual stations (vSTAs) per subsystem; radios configurable for sniffing
- Supports uplink (UL) and downlink (DL) OFDMA and DL multi-user MIMO (MU-MIMO) testing simultaneously
- Real-time analysis of receive signal strength indicator (RSSI), data rate, modulation coding scheme (MCS), spatial streams, channel width, and other physical layer metrics
- Synchrosniffer captures packets in PCAP format to Wireshark in real time; all probes synchronized via Precision Time Protocol (PTP)
- Multipoint-to-multipoint traffic via Multiperf with automatic recovery from dropped links during long test sequences
- Two 10 Gbps Ethernet ports — one for traffic, one for management and PCAP streaming
- Compatible with Intel BE200 and Qualcomm WCN7851 chipsets for both Windows and Linux driver testing
- Available standalone (open module) or integrated into Smartbox-STA (4 units), STAbox (16 units), or Palbox (16 units plus Pal-7 subsystem)
- REST API for test automation
Landslide E20
The Keysight Landslide E20 is a 1U rack-mount appliance for over-the-air testing of up to 8 real handsets across 4G, 5G, and Wi-Fi networks.
The Keysight Landslide E20 is a 1U rack-mount appliance for over-the-air testing of up to 8 real handsets across 4G, 5G, and Wi-Fi networks.
Landslide E20
LN1E20AT
The Keysight Landslide E20 is a 1U rack-mount appliance for over-the-air testing of up to 8 real handsets across 4G, 5G, and Wi-Fi networks.
The Landslide E20 is a compact, rack-mountable OTA test server that validates subscriber experience using real handsets across 4G, 5G, and Wi-Fi networks.
Key specs
- 1U rack-mount form factor (17.2″ × 25.6″)
- Supports up to 8 real handsets via USB-C
- 1 Gigabit Ethernet test port
- 600 W power supply; dual-voltage AC input
Capabilities
- Ready-to-run OTA test library covering voice, video, messaging, web, and latency
- Custom test creation with full handset gesture control (taps, swipes, long presses)
- Mobility testing across 4G, 5G, and Wi-Fi — including handoffs and signal-loss scenarios
- Dual SIM Dual Standby (DSDS) validation for MNO/MSO switching behavior
- Simulated roaming across home and visited networks with QoE metrics
Integration
- Managed by the C50 or C100 Test Manager (C100 supports up to 128 E20s; C50 supports up to 32)
- API/SDK-based test design — resilient to handset UI changes
Active Probe, 2 GHz
Ideal for digital system design, component design/characterization, and educational research applications.
Ideal for digital system design, component design/characterization, and educational research applications.
Active Probe, 2 GHz
N2796A
Ideal for digital system design, component design/characterization, and educational research applications.
Key Features:
- 2 GHz bandwidth (-3dB)
- High resistance (1MΩ) and low capacitance (1 pF) input for low loading
- Wide input dynamic range (±8V) and offset range (±12V)
- Built-in headlight for better visibility while probing
- Includes various probe tip accessories
- Direct connection to AutoProbe interface (no power supply required)
Compatible Oscilloscopes:
- Keysight InfiniiVision 3000/3000T X-, 4000 X-, 6000 X-, 5000, 6000 (except 6000 100 MHz), 7000 and Infiniium 9000, S-Series and 90000A Series.
The N2796A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±12 V), the probe can be used in a wide variety of applications.
For high signal integrity probing, the N2796A 2 GHz active probe is a perfect complement to Keysight’s 1 GHz bandwidth Infiniium and InfiniiVision Series scopes. The N2796A can also be used with Keysight’s 2.5 GHz or higher bandwidth Infiniium 9000 or 90000 Series scopes as a low-cost alternative to 1156A-1158A active probe or InfiniiMax probe.
The N2796A is equipped with a white LED headlight to illuminate the circuit under test. The probe is powered directly by the InfiniiVision and Infiniium AutoProbe interface, eliminating the need for an additional power supply. The probe also comes with a number of accessories that allow for easy connections to the circuit under test.
Clock Glitcher
Test your device’s resistance to clock glitching attacks with the DS1150A Clock Glitcher, which includes two internal clock generators.
Test your device’s resistance to clock glitching attacks with the DS1150A Clock Glitcher, which includes two internal clock generators.
Clock Glitcher
DS1150A
Test your device’s resistance to clock glitching attacks with the DS1150A Clock Glitcher, which includes two internal clock generators.
Test your device’s resistance to modified clock signal attacks. Clock glitching is a technique where the supplied clock of a target device is temporarily modified to different clock cycles, causing the behavior of the device to deviate from its normal behavior. This deviation can lead to vulnerabilities and exploits.
The DS1150A Clock Glitcher operates by supplying the normal clock signal as well as the modified clock signal to the target device, enabling you to test if your devices are resistant to attackers that use modified clock signals to compromise their security.
- Includes two internal clock generators that can be configured independently
- Switch between the normal clock and the glitch clock based on a trigger signal
- Clock signal between 1 KHz and 300 MHz; voltage level between -1 V and +4 V
- Glitch clock has three clock modes: configurable digital output, random digital output, and random analog output
- Flexible analog frontend allows easy interfacing with various target types
- Reference signal measures the generated clock signal
- Includes Piñata target with the clock signal exposed
