Choose a country or area to see content specific to your location
What are you looking for?
-
-
3D Interconnect Designer
3D Interconnect Designer provides a flexible modeling and optimization environment for any advanced interconnect structure, including chiplets, stacked die, packages, and PCBs.
-
Save up to 50% on an XR8 Oscilloscope
Get faster digital validation for less with a trade-in.
-
Discover Keysight AI Data Center Builder
Emulate every part of your data center infrastructure. Emulate Anything. Optimize Everything.
-
-
Introducing AI-Enhanced Packet Brokers
With extra memory and storage, these enhanced NPBs run Keysight's AI security and performance monitoring software and AI stack.
-
Precision In-Circuit Testing for Production
Achieve fast, accurate board-level testing with robust inline and offline ICT designed for modern manufacturing.
-
Accelerate Your Innovation Engine
Explore curated support plans, prioritized to keep you innovating at speed.
-
448 Gb/s Waveform Generation
Achieve 200+ Gbaud multi-level modulated signals with high-speed AWGs for digital and optical standards.
-
Stream 120 MHz I/Q Data to Your Laptop in the FieldPinpoint interference with post-processing spectrum management software in the lab.
Find the Right ATE Power SolutionUse this selector tool to quickly identify the best power supply for your aerospace and defense ATE requirements.
-
- Solutions
-
Authoritative application notes, data sheets, reference designs, and test procedures to accelerate design and validation decisions.
FeaturedHands‑on bootcamps that teach system design, test methods, and production workflows engineers can apply immediately.
Success Stories
HPE Juniper Networking Builds Next-Gen AI Infrastructure - Buy
-
Quick access to support related self-help tasks.
Additional content to support your product needs.
Do more with Keysight ServicesExplore services to accelerate every step of your innovation journey.
Accessories
Explore the complete portfolio of Keysight accessories designed to complement and extend your instruments. Use the filters below to quickly find compatible accessories such as modules, cables, adapters, and other system components to configure, expand, and optimize your test system for your specific measurement needs.
Showing 12 of 1583
-
126
-
994
No Filter available
InfiniiMax Ultra Probe Amplifier, 25 GHz
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
InfiniiMax Ultra Probe Amplifier, 25 GHz
MX0025A
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
- Test and validate high-speed technologies such as DDR5 / MIPI with the 25 GHz probe amplifier (AP2).
- Experience the highest input impedance in midband frequencies for low-energy probing.
- Boost test margins with the lowest signal degradation.
- Probe small devices with the super-flexible micro probe head or choose from the widest variety of compatible probe heads for your unique application.
- Measure differential, single-ended, and common mode signals with a single probe tip.
- Use with Infiniium UXR-, 90000 X-, Q-, V-, and Z-Series oscilloscopes.
Keysight’s MX0025A InfiniiMax Ultra Series probe amplifier improves usability because you can measure differential, single-ended, and common mode signals with a single probe tip.
When you use a probe to connect your signal to your oscilloscope, it becomes part of the circuit affecting your test. Your probe may be hiding signal details, loading down your signal, or distorting it. InfiniiMax Ultra Series probes have the lowest loading for minimal impact to your circuit. Boost your test margins and gain measurement confidence with their unprecedented accuracy. Ensure your entire measurement system is helping you see the truest representation of your signal.
These probes have the lowest noise and capacitive loading and the lowest loading across more frequencies due to their RC high impedance profile. The InfiniiMax Ultra Series supports InfiniiMode and has a user-defined AC calibration mode, a wider input voltage range, more accuracy with unique S-parameter characterization, lower capacitive loading, a wider input voltage range, micro / socketed probe heads for smaller density probing, and more bandwidths. The InfiniiMax Ultra Series has an RC input impedance architecture with the lowest loading and least signal distortion across the widest frequency range.
InfiniiMax Ultra probes have three attenuation ranges — 1:1, 4:1, and 8:1 — giving you superior noise performance and large voltage ranges, all while maintaining maximum bandwidth. The input range automatically configures depending on the size of the input signal and vertical scale of your oscilloscope.
Choose from the three flexible input dynamic ranges from 600 mVpp at 1:1, 2.5 Vpp at 4:1, and 5 Vpp at 8:1. Clearly see and know when your design is satisfactory, keep up with standards, easily probe small devices, and reduce test complexity with the InfiniiMax Ultra Series probes.
Pattern Based Trigger Generator
The DS1002A Pattern Based Trigger Generator lets you generate time independent pulses for side channel analysis or fault injection testing.
The DS1002A Pattern Based Trigger Generator lets you generate time independent pulses for side channel analysis or fault injection testing.
Pattern Based Trigger Generator
DS1002A
The DS1002A Pattern Based Trigger Generator lets you generate time independent pulses for side channel analysis or fault injection testing.
Generating a trigger pulse at the right point in time is essential in fault injection (FI) and side channel analysis (SCA) testing, but clock jitter and random program interrupts make this difficult, resulting in inaccurate timing.
The DS1002A Pattern Based Trigger Generator solves this problem by generating a trigger pulse after detecting a pattern in the EM signal of a chip. A special narrow band-pass filter enables pattern detection even in noisy signals.
1064 nm Multimode Fault Injection Laser
The DS1112A is a 1064 nm wavelength near infrared (NIR) multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1112A is a 1064 nm wavelength near infrared (NIR) multimode diode laser for fault injection, with a high power rating and configurable pulse length.
1064 nm Multimode Fault Injection Laser
DS1112A
The DS1112A is a 1064 nm wavelength near infrared (NIR) multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1112A 1064 nm Multimode Fault Injection Laser uses multimode laser diodes with a high power rating, enabling coarse chip surface scanning with large spot size and sufficient intensity within spot.
- 1064 nm wavelength NIR laser
- Laser pulse power: 30 W
- Configurable pulse length as small as 2 ns
- High pulse frequency allows multi-pulse fault injection attacks
- Short delay between trigger pulse and actual light pulse in combination with minimal jitter allows for accurate laser pulse timing
- Wide range of spot size: Choose from coarse to detailed chip surface scanning with objectives and spot size reducer
- Long-life laser diode with minimal aging
- Integrates with Keysight products DS1101A, DS1102A, DS1160A, and DS1180A
30 A Glitch Amplifier
Deliver a reliable glitch for targets consuming up to 10 A of current.
Deliver a reliable glitch for targets consuming up to 10 A of current.
30 A Glitch Amplifier
DS1141A
Deliver a reliable glitch for targets consuming up to 10 A of current.
Injecting faults on an embedded device using power requires dedicated equipment. For a reliable glitch to be delivered to the target, the power supply needs to deliver sufficient power with minimal noise — and have sufficient power to generate steep voltage spikes. It is also necessary to monitor power consumption to identify areas of interest and see target behavior. The Keysight 30 A Amplifier combines these functionalities in one stand-alone component for targets consuming up to 10 A of current (peak-to-peak).
The DS1141A model provides the following features:
- Convenient add-on to Keysight’s Glitch Pattern Generator or Smartcard Voltage and Clock Glitcher to amplify the power glitches for an embedded processor
- Includes internal voltage and current monitor
- Includes two external power supplies
Bidirectional Fault Injection Probe
The DS1121B Bidirectional Fault Injection Probe delivers high power electromagnetic (EM) pulses to precise, user-defined locations on a target device. Its rapid pulse generation is designed to meet the stringent requirements of both commercial and certified testing environments.
The DS1121B Bidirectional Fault Injection Probe delivers high power electromagnetic (EM) pulses to precise, user-defined locations on a target device. Its rapid pulse generation is designed to meet the stringent requirements of both commercial and certified testing environments.
Bidirectional Fault Injection Probe
DS1121B
The DS1121B Bidirectional Fault Injection Probe delivers high power electromagnetic (EM) pulses to precise, user-defined locations on a target device. Its rapid pulse generation is designed to meet the stringent requirements of both commercial and certified testing environments.
Keysight’s Inspector software enables full control of the EMFI probe setup, including probe positioning, XY stage movement, and camera operation. The platform supports automated test execution and streamlined reports to facilitate analysis and optimization of test results. The bidirectional probe can operate independently, within customized setups, or be integrated into existing user-defined hardware and software frameworks.
With increasingly challenging chip packages and sophisticated light-sensitive sensors to prevent optical laser faults, this new testing vector for fault injection scenarios bypasses traditional measures and takes the next step in high-end security tests.
The Keysight bidirectional fault injection probe offers the following features:
- Includes New and Improved Amplifier Unit
- Eliminates the need for chip de-packaging
- Supports configurable, high-power EM pulses with interchangeable coils for varied field profiles
- Allows precise adjustment of short, fast pulse characteristics via software
- Reduces risk of permanent device damage compared to laser-based methods
- Enables targeted bit flips within logic elements
- Compatible with Keysight precision XYZ stages and multimode laser systems for automated scanning workflows
- Supplied with standard EM-FI transient coils and a crescent-shaped ferrite probe
Automotive Security Test Tool
Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios.
Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios.
Automotive Security Test Tool
DS1170A
Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios.
Pinpoint vulnerabilities and improve security for electronic circuits in vehicles using the Keysight DS1170 automotive security test tool. Developers can easily integrate the tool in their existing test bench to execute predefined attack scenarios and establish a security baseline for either a specific electronic control unit (ECU) or a combination of ECUs. Accompanying software streamlines control of the automotive security test tool and interpretation of results. Optimize your security setup with the ability to control multiple DS1170 automotive security test tools with one dashboard and share information between them.
Complexity in cars is increasing constantly. While the increase in electronic units in vehicles allows for a better driver experience, it also increases the number of points an attacker can exploit. By adding the DS1170 to your vehicle security development testing, you can increase security measures and stay ahead of threats. Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios. It offers the following features:
- Standard connectors to easily integrate the tool in your existing test bench
- Ability to record and replay control area network (CAN) messages to emulate an ECU
- Automated fuzzing capabilities to test the robustness of any ECU
- Traffic-driven triggering capabilities to extend your test scenarios with side channel analysis (SCA) and fault injection (FI)
- Prepared for ISO 21434
- Smart, active bus scanning in the discovery phase to record traffic
- Access to all low-level functions used in the predefined test scenarios to help you compose your own scenario
- Ability to analyze bus traffic in real-time and manipulate messages
- Use python or command-line for scripts
1310 nm Single Mode Side Channel Laser Source
Perform side-channel measurements with this 1310 nm single-mode continuous wave diode laser.
Perform side-channel measurements with this 1310 nm single-mode continuous wave diode laser.
1310 nm Single Mode Side Channel Laser Source
DS1210A
Perform side-channel measurements with this 1310 nm single-mode continuous wave diode laser.
The DS1210A is a continuous-wave laser source with very precise power output. Use it for side-channel measurements based on failure analysis methodologies applied for side channel analysis.
- 1310 nm continuous-wave laser
- Single mode
- 500 mw
- Long-life laser diode for minimal aging
- Choose from coarse to detailed chip surface scanning with a 100:1 spot size range
- Use with DS1101A Fault Injection Laser System and DS1102A Dual Laser Fault Injection System
- Control optical power with DS1160A Smartcard Voltage and Clock Glitcher or DS1180A Glitch Pattern Generator
Fault Injection Laser System
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
Fault Injection Laser System
DS1101A
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
Protecting chips against laser fault attacks is one of the main security challenges in the smart card industry. With the DS1101A Fault Injection Laser System, perform advanced laser fault attacks that meet the highest international standards to assess if a smart card is secured against laser attacks. The DS1101A offers a set of new features meeting the latest timing and power requests from fault injection experts around the world. The special set of lasers with dedicated optics and ultra-fast and flexible control create the ultimate fault injection test solution. Its integration with the Inspector software further ensures that automation and analysis are covered by extendible modules which are flexible and easy to use.
- Supports front- and back-side attacks
- Integration with Inspector’s software and fault analysis modules
- Zoomable camera for easy navigation and automated Z-axis
- Fast multi-time glitching and accurate digital scaling with fast and predictable response to trigger pulse
- Multi-spot and IR navigation upgrades available
- Automatic scanning of a chip’s surface with integrated motorized XYZ stage
- Camera inspection of laser spot and location on chip area
- High repetition accuracy on motorized axes
- SDK available for integration into custom setups
Automotive Ethernet Test Fixture
The AE6941A Automotive Ethernet Test Fixture provides easy access to automotive Ethernet signals for conformance testing and device characterization.
The AE6941A Automotive Ethernet Test Fixture provides easy access to automotive Ethernet signals for conformance testing and device characterization.
Automotive Ethernet Test Fixture
AE6941A
The AE6941A Automotive Ethernet Test Fixture provides easy access to automotive Ethernet signals for conformance testing and device characterization.
The AE6941A Automotive Ethernet Electrical Test Fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
You can use this breakout board with the AE6942A, AE6943A, and AE6960A adapters to support the Keysight AE6900T, AE6900R, and AE6900L automotive Ethernet electrical conformance applications to provide fast and accurate design validation and debug of transmit receive and link segment signals.
Features
- Complete 100BASE-T1 automotive Ethernet signal access for conformance testing and characterization
- Compliant with IEEE 802.3bw and IEEE 802.3b
- Flexible subMiniature A (SMA) connections for ease-of-use
- Versatile adapter boards available for various connector types including Mini-50, MATEnet and H-MTD
Supports standards
- IEEE 802.3bw 100 Mb/s
- IEEE 802.3bp 1000 Mb/s
- IEEE 802.3ch multigigabit
Bidirectional Fault Injection Probe
Induce electromagnetic pulses to perform localized faults on modern chips.
Induce electromagnetic pulses to perform localized faults on modern chips.
Bidirectional Fault Injection Probe
DS1121A
Induce electromagnetic pulses to perform localized faults on modern chips.
The Keysight DS1121A bidirectional fault injection probe induces high power, electromagnetic (EM) pulses on a user-defined chip location. The fast and predictable pulse meets the demands of international testing laboratories and manufacturers.
Testers can control the set of probes, XY table, and camera with Keysight’s EM fault injection software, which also allows automation of testing scenarios and easy reporting for further analysis and refinements. Use the bidirectional fault injection probe in stand-alone or custom environments—or integrate with your own hardware and software.
With increasingly challenging chip packages and sophisticated light-sensitive sensors to prevent optical laser faults, this new testing vector for fault injection scenarios bypasses traditional measures and takes the next step in high-end security tests.
The Keysight bidirectional fault injection probe offers the following features:
- Does not require chip de-packaging
- Light sensor meshes do not detect EM glitches
- Flips value of logic cells on target device
- Offers lower chance of permanent chip damage compared to laser glitching
- Enables adjustable high power pulses and includes different coils to generate different EM fields over a chip
- Allows configuration of fast and short pulses with software
- Provides fast and predictable response to trigger
- Fits Keysight precision XYZ stage and multimode fault injection laser for automated scanning
- Includes standard EM-FI transient coils and one crescent probe ferrite
Unidirectional Fault Injection Probe
The DS1120A Unidirectional Fault Injection Probe performs localized faults on modern chips using fast, predictable, and high-powered electromagnetic pulses.
The DS1120A Unidirectional Fault Injection Probe performs localized faults on modern chips using fast, predictable, and high-powered electromagnetic pulses.
Unidirectional Fault Injection Probe
DS1120A
The DS1120A Unidirectional Fault Injection Probe performs localized faults on modern chips using fast, predictable, and high-powered electromagnetic pulses.
With increasingly challenging chip packages and sophisticated light-sensitive sensors employed to prevent optical laser faults, Keysight presents a new, powerful testing vector for fault injection (FI) scenarios on modern chips. The Unidirectional Fault Injection Probe induces fast, high-powered, electromagnetic pulses on a user-defined location of a chip. Unidirectional FI testing allows you to bypass traditional countermeasures and provides the next step in high-end security tests.
The DS1120A’s easy setup and testing process saves time, providing a fast and predictable pulse that meets international testing lab and manufacturer requirements. The set of probes, XY table, and camera offer a complete setup that testers can control and parameterize flexibly through the Inspector FI software. The software allows testing automation and easy reporting for further scenario analysis and refinements. The Unidirectional Fault Injection Probe can be used standalone or in custom environments as well as integrated with your own hardware and software.
- Does not require de-packaging the chip
- Electromagnetic glitches not detected by light sensor meshes
- Flips value of logic cells on target device
- Lower chance of permanent chip damage compared to laser glitching
- Adjustable, high-powered pulses
- Different coils included to generate different electromagnetic fields over a chip
- Fast and short pulses configurable from software
- Fast and predictable response to trigger
- Fits Precision XYZ Stage of High Precision Electromagnetic Probe for automated scanning
Mounts on Precision XYZ Stage of High Precision Electromagnetic Probe with:
- 1 Crescent probe ferrite
- High Precision Fault Injection Probe Tips
Dual Laser Fault Injection System
Reproduce a successful dual laser fault injection by generating two laser spots using the DS1102A Dual Laser Fault Injection System.
Reproduce a successful dual laser fault injection by generating two laser spots using the DS1102A Dual Laser Fault Injection System.
Dual Laser Fault Injection System
DS1102A
Reproduce a successful dual laser fault injection by generating two laser spots using the DS1102A Dual Laser Fault Injection System.
Countermeasures for fault injection are becoming more advanced. To bypass some of these countermeasures, a security evaluator needs to be able to generate multiple laser pulses at different locations. The DS1102A lets you generate two laser spots with independent location and timing.
- Work with different laser sources
- Speed up the evaluation process
- Perform multi-pulse attacks with DPSS laser
- Control automated scanning with Inspector and motorized positioning of both laser spots
- Achieve high position accuracy and resolution
- Use the wide field of view to create a relatively large distance on die between two laser spots
