High-speed digital standards are quickly evolving to keep pace with emerging technologies such as 5G, Internet of Things (IoT), artificial intelligence (AI), virtual reality (VR), and autonomous vehicles.

Each generational change introduces new test challenges for your digital designs. You need to test your high-speed digital designs across all product development stages — from design and simulation, analysis, debug, and compliance test. We can help you anticipate test challenges, optimize performance, and accelerate time-to-market of your high-speed computing interfaces, data center connections, and consumer electronics.

High-Speed Computing Interfaces

Faster networking speeds require faster memory and faster serial bus communications. Peripheral Component Interconnect Express (PCIe®) expansion bus speeds are evolving from PCIe 4.0 to PCIe 5.0 to support these increased speeds. The same is true for memory, as double date rate (DDR) memory evolves from DDR 4.0 to DDR 5.0. Increasing speeds of serial data communications requires precision high-speed testing at every level. Testing at these faster speeds requires full compliance testing to the latest standards.

PCI-SIG®, PCIe®and PCI Express®are US registered trademarks and/or service marks of PCI-SIG.

Data Center Connectivity

Data center speeds are moving quickly from 100 gigabits per second (Gbps) to 400 Gbps to support exploding computing and performance demands in the network. Multilevel signal modulation technologies, such as 4-level pulse amplitude modulation (PAM4), will enable 400GE. You need scalable, reliable, and high-performance interconnectivity both inside the data center (intra-DCI) and between data centers (inter-DCI). We can help you seamlessly reach the next speed class in your high-speed digital interconnects.

Standard

Ethernet

Consumer Electronics

5G and IoT will enable billions of new devices, such as smartphones, tablets, personal computers (PCs), and home entertainment systems, to connect to the network faster than ever before. You need to design interfaces to your consumer electronics using next-generation high-speed digital standards. Each new generation introduces new test challenges. Whether you are using Mobile Industry Processor Interface (MIPI) for your mobile device interfaces, High Definition Multimedia Interface (HDMI) for digital audio or video, or Universal Serial Bus (USB) for a wide range of consumer electronics, we can help you ensure the quality and performance of your devices.

Further Reading

eBooks 2018.08.29

400GE is Revolutionary, Not Evolutionary

400GE is Revolutionary, Not Evolutionary

This ebook outlines the three key challenges that data center operators face as they transition from 100GE to 400GE, and provides detailed information on how to overcome these challenges to increase channel capacity, guarantee quality, and reduce test time and cost.

2018.08.29

eBooks 2019.08.02

4 Key Considerations for 5th Generation High-Speed Digital Designs

4 Key Considerations for 5th Generation High-Speed Digital Designs

Faster networking requires faster memory and faster serial bus communications. As data center operators begin the migration of their data center networks from 100GE to 400GE, they need a migration plan that delivers the next-generation of high-speed computing interfaces such as PCIe 5.0 and DDR5.

2019.08.02

Brochures 2018.05.24

Data Center & Infrastructure Glossary of Terms

Data Center & Infrastructure Glossary of Terms

This document contains a list of terms and their definitions for the data center infrastructure industry.

2018.05.24

White Papers 2018.06.21

400GE Transceiver Characterization and Compliance Test: Addressing Top Three Concerns of Data Center Operators

400GE Transceiver Characterization and Compliance Test: Addressing Top Three Concerns of Data Center Operators

Learn how 400GE transceivers address the three main concerns that data center operators have when considering the move from 100GE to 400GE: Cost, Footprint and Power.

2018.06.21

White Papers 2018.06.21

Reduce Test Time, Reduce Cost: Data Center Component and Transceiver Test

Reduce Test Time, Reduce Cost: Data Center Component and Transceiver Test

Test time contributes significantly to overall transceiver cost. Learn how more efficient testing of the broad range of transceiver data rates accelerates innovation and lowers cost. The process begins in the research and development phase with the design of transceiver components, continues to the design and validation of the transceivers, and then through to manufacturing test.

2018.06.21

White Papers 2019.10.22

Signal Integrity Measurement Analysis

Signal Integrity Measurement Analysis

Learn how to address signal integrity problems early, to ensure optical circuit design and development that works reliably at a reasonable cost.

2019.10.22

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