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segmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076bsegmentation:campaign/Digital_High_Performance,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_Sampling,segmentation:business-unit/CSG,keysight:product-lines/8f,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:models/n1/n1076b
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Messen Sie seriellen Hochgeschwindigkeitsjitter, wenn das Prüfling keinen separaten synchronen Takt bereitstellt. Ermitteln Sie das Timing direkt aus den seriellen NRZ- oder PAM4-Daten und verwenden Sie den ermittelten Takt als Referenz für Jitter- und Augenwinkelmessungen. Konfigurieren Sie die Bandbreite und die Spitzenwerte der Taktrückgewinnungsschleife, um die Erfassung von Timingabweichungen zu steuern, und untersuchen Sie frequenzabhängige Jitterkomponenten mithilfe der Jitter-Spektrumanalyse.
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