Fast RF Device Testing with Analog Sources

This application note discusses the use of analog signal generators for fast RF device testing, highlighting the capabilities and applications of Keysight's compact RF and microwave analog signal generators, AP5001A and AP5002A. These signal generators are designed to provide stable and reliable signals for testing and evaluating electronic circuits and devices, making them ideal for various applications in research and development (R&D), manufacturing test, and field test.

Introduction: Signal generators, also known as signal sources, are essential tools for providing stable and reliable signals for testing electronic circuits and devices. Keysight's AP5001A and AP5002A signal generators offer a wide output power range, low phase noise, and fast frequency and amplitude switching speed, making them suitable for a variety of applications. Despite their compact and lightweight design, these signal generators do not compromise on performance.

Receiver Testing: Testing receivers is crucial to ensure their efficient operation in real-world conditions, whether for consumer, military, or industrial use. The AP5002A signal generator, with its high output power and modulation capabilities, is ideal for simulating real-world conditions, including high-power blockers. This section discusses the use of signal generators for testing receiver performance under various conditions, including power calibration and RSSI measurements.

LO / Clock Substitution: During product development, signal generators can be used as substitutes for local oscillator (LO) and clocking subsystems. This section explains how the AP500xA signal generators can be used to confirm system operation with high-purity signal sources, ensuring low phase noise and low spurious signals. The benefits of using signal generators as substitutes for oscillator and clock components are highlighted.

Amplifier Testing: Amplifiers are designed to increase the output power of signals without distorting the information they carry. This section covers the characterization and verification of key amplifier parameters, such as gain and gain compression, using signal generators. The AP500xA signal generators provide fast switching speed and high output power, making them ideal for manufacturing test.

Intermodulation (IM) Testing: Nonlinear distortion, known as third-order intercept (IP3), is a key parameter for amplifiers. This section discusses the measurement of IM distortion using two-tone signals and the importance of specifying the intercept point for comparing nonlinear performance between amplifiers. The AP500xA signal generators are used to generate two-tone signals for IMD measurements.

Conclusion: The application note concludes by emphasizing the importance of signal sources with fast switching speed, outstanding signal purity, and superior output power for accelerating product development. Keysight's AP500xA signal generators offer these capabilities, along with additional features such as AM, FM, PM, and pulse modulation, making them ideal for various testing applications.

Additional Resources: The application note provides links to the product pages for the AP5002A and AP5001A signal generators, as well as information about Keysight's commitment to innovation and technical support.