Smart Data Clipping for LF Noise Measurement
Applikationsberichte
Turnkey Solution for LF Noise Measurement
Keysight E4727B (Advanced Low-Frequency Noise Analyzer; A-LFNA) allows you to measure the LF (Low Frequency) noise of semiconductor devices very easily. The E4727B consists of hardware and software. The user can measure LF noise by just entering the expected measurement conditions and the software will then set all parameters of hardware optimally. The software of E4727B has many capabilities and analysis functions based on long-term experience in LF noise measurement history. One of the most important points in the software is to show whether the measured data is DUT’s noise or system noise. It is very difficult to judge if your data is really DUT noise because the DUT noise is very small and not stable. The E4727B software can indicate the DUT noise very easily by the Data Clipping function.