How to Measure Fast Device Step Response

+ PXIe Precision SMU

Capture Fast Voltage Step Response

Step-response measurement requires applying a controlled voltage transition and sampling the resulting voltage over time. The source must transition rapidly to the target voltage while the measurement system acquires enough time-domain samples to resolve the rising edge and subsequent settling behavior. Measurement timing, source range, sampling aperture, and acquisition points are configured for the expected transient duration.

The acquired samples form a voltage-versus-time waveform that can be evaluated for transition and settling characteristics. A source measure unit (SMU) operating in digitizing mode can generate the voltage step and capture the resulting transient waveform with a single instrument. The measured waveform can then be compared with an oscilloscope capture when additional time-domain verification is required.

Fast Step Response Measurement Solution

Measuring step response requires applying a rapid voltage transition while acquiring enough time-domain samples to resolve the rising edge and settling behavior. The Keysight PXIe Precision Source / Measure Unit combines voltage sourcing with digitizing measurement capability for this workflow. It supports sampling rates up to 1.25 MSa/s and a maximum slew rate of 1.4 V/µs. The application note demonstrates a 40 V step-response measurement using a manual 800 ns aperture and 100 digitizing points. The resulting voltage-versus-time waveform provides a direct view of the transient response and can be compared with an oscilloscope measurement.

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