Functional Interconnect Test Solutions 8 Channel Configuration

Keysight's Functional Interconnect Test Solutions (FITS-8CH) is designed to support interconnect error performance validation for next-generation Ethernet and high-speed connectivity technologies. This demonstration highlights the key test setup and configuration capabilities available within the platform, providing an overview of how engineers can prepare systems for validation and measurement. Designed for 1.6T interconnect error performance validation, FITS-8CH provides eight independent transmit channels and eight independent receive channels, enabling comprehensive testing of multi-lane interconnects. Built-in Bit Error Rate (BER) measurement and Forward Error Correction (FEC) monitoring capabilities provide visibility into link quality and error correction performance across all lanes, supporting efficient evaluation of high-speed interconnect behavior. FITS-8CH supports operation at 212 Gb/s, 106 Gb/s, and 53 Gb/s per lane, enabling validation of 1.6T, 800G, and 400G Ethernet technologies. This flexibility allows engineers to address a broad range of device, component, and system-level validation requirements using a common test platform. The demonstration showcases the software interface used to configure test parameters and establish links for measurement. For applications requiring FEC validation, FEC monitoring can be enabled to evaluate link performance and observe error correction activity during testing. These capabilities help engineers gain additional insight into link behavior while validating interconnect performance at high data rates. FITS-8CH also provides a variety of test pattern options to support both validation and IEEE compliance testing requirements. Available patterns include PRBS13Q, PRBS31Q, SSPRQ, and square wave, along with additional pattern selections that can be used to generate the signals required for specific test scenarios. Multiple pattern options provide the flexibility needed to address diverse validation environments and testing objectives. In addition to pattern generation capabilities, FITS-8CH supports clock generation and divided clock functionality to accommodate a wide range of clocking requirements. These capabilities simplify test setup while providing the flexibility needed for different devices and system architectures. The demonstration also highlights the straightforward channel activation process. After confirming the required settings, engineers can enable transmit channels, which are activated sequentially. Each channel can be configured independently, allowing users to tailor test conditions to specific devices and interconnect configurations. Receive channel configuration follows a similarly streamlined workflow. Once enabled, signal detection indicators provide immediate confirmation that a link has been successfully established and is ready for measurement. By combining flexible test configuration, multi-lane channel support, BER measurement, FEC monitoring, clocking options, and simplified link establishment within a single platform, FITS-8CH provides an efficient approach to preparing and validating high-speed interconnect test environments. These capabilities help engineers accelerate validation workflows and support the development of next-generation Ethernet and high-speed connectivity technologies.