Simulate Double Pulse Signals for Digital IC Testing

This demonstration video, presented by Lau Pui Ching, Product Manager at Keysight Technologies, explores how to simulate double pulse signals for digital integrated circuit (IC) testing using the Keysight Smart Bench Essentials Plus (SBE+) Trueform function generator. The video, approximately 3 minutes and 30 seconds long, provides a practical, step-by-step guide to generating precise, repeatable waveforms essential for evaluating the dynamic switching performance of power transistors and power stages in ICs.

The double pulse test is a widely adopted method in power electronics to assess switching behavior, efficiency, and thermal performance. It involves applying two consecutive pulses to a device under test (DUT), allowing engineers to observe switching transitions and measure parameters such as rise/fall times, overshoot, and ringing. Accurate signal generation is critical in this context, and the Keysight Trueform function generator is designed to meet these demands.

The video begins by explaining the importance of using a high-performance function generator for double pulse testing. The Trueform generator offers nanosecond-level control over pulse width, frequency, and spacing, ensuring clean, consistent signals with minimal jitter and noise. This precision helps prevent device damage and ensures reliable, repeatable test results.

The demonstration setup includes:

• The SBE+ 100 MHz Trueform function generator
• A 14-bit, 4-channel HD3 oscilloscope
• A laptop running Keysight BenchLink Waveform Builder Pro software
• And standard connection cables
• The process begins with launching the BenchLink software and creating a custom double pulse waveform using the Trueform waveform editor. The first pulse is configured with an 18 ms width and 20 ms total duration, followed by a second pulse with a 3 ms width and 25 ms total duration. This waveform is then transferred to the function generator either via USB connection or external flash drive.

Once loaded, the waveform is output to the oscilloscope, which acts as the DUT in this demo. The oscilloscope captures and displays the waveform, allowing users to verify signal integrity and timing accuracy. The video demonstrates how to adjust the oscilloscope’s time and voltage scales for optimal viewing.

Beyond double pulse testing, the Trueform function generator supports a wide range of digital IC testing applications. These include generating high-frequency pulses, serial data streams, and custom waveforms for noise injection. With bandwidths up to 100 MHz, jitter below 50 ps, and advanced sequencing capabilities, Trueform technology delivers unmatched signal fidelity and flexibility.

Key benefits highlighted include:

• Low jitter, ideal for precise timing applications
• Clean, accurate signals with minimal distortion
• Point-by-point waveform generation for exact waveform reproduction
• Flexible sampling rates without aliasing or distortion
• In conclusion, this demo illustrates how the Keysight SBE+ Trueform function generator simplifies the creation of complex test signals, enabling engineers to perform accurate and efficient digital IC testing. Its combination of precision, programmability, and ease of use makes it an essential tool for modern electronics development and validation.