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20 GHz

The SG6311A PSG reveals true device performance with metrology-grade purity, clean, calibrated power, and two independent channels that expand test capacity in a compact 2U platform with confidence.

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  • Harmonics @ 1 GHz

    -55 dBc

  • Maximum frequency

    20 GHz

  • Output power @1 GHz

    21 dBm

  • Phase noise @1 GHz (20 kHz offset)

    -153 dBc/Hz

  • Number of outputs

    2

  • Frequency switching speed

    7000 µs

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Highlights

The SG6311A PSG reveals true device-under-test performance with metrology-grade signal purity, exceptionally low noise, and high, calibrated output power. Its compact dual-channel design and compatibility with existing test environments help teams expand test capacity, accelerate deployment, and scale advanced test setups with greater confidence and efficiency. The result is trusted measurements, clearer insight, and faster progress from initial evaluation through deployment.

  • Minimize source limited uncertainty with ultra-low phase noise that doesn’t mask DUT behavior.
  • Improve residual phase-noise and amplifier performance measurements with low AM noise that provides a cleaner reference for demanding metrology and advanced R&D applications.
  • Validate advanced devices and systems with high SNR requirements with an exceptionally low broadband noise floor.
  • Deliver the signal level needed at the device and through lossy test setups with high, clean, calibrated output power.
  • Expand test capacity without increasing footprint with two fully independent channels in a compact 2U design—saving up to 4× rack space.
  • De-risk technology refreshes by leveraging existing automations with SCPI compatibility, familiar rear‑panel connections, and default settings aligned with previous-generation PSG instruments.
  • Address diverse test needs with one signal generator, leveraging the hybrid YIG/DDS architecture and software mode switching to optimize performance across applications.

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