C1281A ASUR Single Device Reliability (ASUR SDR)

• Single-site device reliability
• Unified hardware and software
  reliability solution
• Core Wafer Systems PDQ-WLR®
  algorithms
• Interactive measurements and
  low-cost parametric test

Cost-effective, scalable systems for reliability and parametric tests for modern manufacturing

Keysight’s Advanced Scalable Unified Reliability (ASUR) family of reliability test products provides a range of solutions for different needs, budgets, experience levels and strategies. The Single Device Reliability (ASUR SDR) product provides a PC and instruments-based solution for single device-at-a-time reliability testing with modest equipment investment using proven reliability test algorithms. ASUR SDR complements the parallel, multi-site
ASUR PDR product which provides advanced accelerated to long-term reliability test with higher throughput.

ASUR SDR is a high-performance, low-cost, accelerated reliability and parametric solution for single-site testing that incorporates the proven accelerated techniques of Core Wafer Systems PDQ-WLR using instruments-based solutions. ASUR SDR is part of the ASUR scalable set of solutions: one hardware, one software, from instruments to system testers.

Reliability test with confidence

JEDEC Standard reliability test algorithms in ASUR are in their fifth generation. This suite is a fully tested and supported with over 10 years of in-field experience and validation.

• Electromigration (EM)
• Bias Temperature Stress (BTS)
• Gate Oxide Integrity (GOI)
• Hot Carrier Injection (HCI)
• Bias Temperature Instability (BTI)

Keysight instruments supported:

• Keysight 4155/6 B/C
• Keysight E5250, B2200 and B2201 switch matrix
• Keysight 81110A, 8114A pulse generators
• Keysight 4284A CV meter
• Keysight 4294A impedance analyzer
• Keysight E5288A ASU, atto-sense unit
• Keysight 41000-400 to -100 series systems
• Keysight power supplies

^{PDQ-WLR® is a registered trademark of Core Wafer Systems}