Wir denken, das dies die Seite ist, die Sie sehen wollten.. Stattdessen Suchergebnisse ansehen:

Können wir Ihnen behilflich sein?

M9484C VXG Radar-Szenen-Emulator AresONE-S 400GE Produkte finden Eine Lösung finden Technische Unterstützung An einem Training teilnehmen Unsere Teilnahme an Veranstaltungen finden Hochwertige Gebrauchtgeräte KeysightCare Online Kauf

No product matches found - System Exception

Kein Bild verfügbar

C1281A ASUR Single Device Reliability (ASUR SDR)

Produkt Status

Obsolete

Technische Unterstützung

Ersatzprodukt

No replacement found for this product.

Kontakt

Überblick und Leistungsmerkmale
Upgrades nach dem Kauf
Ressourcen

HIGHLIGHTS

Single-site device reliability
Unified hardware and software
reliability solution
Core Wafer Systems PDQ-WLR®
algorithms
Interactive measurements and
low-cost parametric test

Cost-effective, scalable systems for reliability and parametric tests for modern manufacturing

Keysight’s Advanced Scalable Unified Reliability (ASUR) family of reliability test products provides a range of solutions for different needs, budgets, experience levels and strategies. The Single Device Reliability (ASUR SDR) product provides a PC and instruments-based solution for single device-at-a-time reliability testing with modest equipment investment using proven reliability test algorithms. ASUR SDR complements the parallel, multi-site
ASUR PDR product which provides advanced accelerated to long-term reliability test with higher throughput.

ASUR SDR is a high-performance, low-cost, accelerated reliability and parametric solution for single-site testing that incorporates the proven accelerated techniques of Core Wafer Systems PDQ-WLR using instruments-based solutions. ASUR SDR is part of the ASUR scalable set of solutions: one hardware, one software, from instruments to system testers.

Reliability test with confidence

JEDEC Standard reliability test algorithms in ASUR are in their fifth generation. This suite is a fully tested and supported with over 10 years of in-field experience and validation.

Electromigration (EM)
Bias Temperature Stress (BTS)
Gate Oxide Integrity (GOI)
Hot Carrier Injection (HCI)
Bias Temperature Instability (BTI)

Keysight instruments supported:

Keysight 4155/6 B/C
Keysight E5250, B2200 and B2201 switch matrix
Keysight 81110A, 8114A pulse generators
Keysight 4284A CV meter
Keysight 4294A impedance analyzer
Keysight E5288A ASU, atto-sense unit
Keysight 41000-400 to -100 series systems
Keysight power supplies

^{PDQ-WLR® is a registered trademark of Core Wafer Systems}

Sortieren nach :

Datum

Datum Titel

Filter Results

No information found for this product

Zurücksetzen

Nach Inhaltsart