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Accurate NBTI Characterization Using Timing-on-the-fly Method

Application Notes

Keysight B1500A Semiconductor Device Analyzer

Controlled dynamic recovery with 100 μs accuracy
No voltage dip between stress and Id measure cycles
Full-scale resolution of 20,000 counts with 100 μs intervals assures accurate NBTI characterization
Timing-on-the-fly NBTI EasyEXPERT library available

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Accurate NBTI Characterization Using Timing-on-the-fly Method

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