Accurate NBTI Characterization Using Timing-on-the-fly Method
Application Notes
Keysight B1500A Semiconductor Device Analyzer
- Controlled dynamic recovery with 100 μs accuracy
- No voltage dip between stress and Id measure cycles
- Full-scale resolution of 20,000 counts with 100 μs intervals assures accurate NBTI characterization
- Timing-on-the-fly NBTI EasyEXPERT library available