How to Characterize Multi-Channel IV

+ Modular Source Measure Unit

Characterize Multi-Channel And Dynamic IV

Multi-channel current versus voltage (IV) characterization requires synchronized source and measurement control, flexible sweep methods, and time-domain capture across multiple device nodes. Engineers may need to run primary sweeps, step-response measurements, and narrow pulsed measurements while controlling compliance, measurement range, timing, and settling so voltage and current results remain aligned across channels.

The characterization process typically combines static current versus voltage sweeps with sampling-based measurements to observe transient response and pulsed waveform behavior in the same environment. It also requires graph and table views to compare channels, verify timing, inspect logarithmic current behavior, and export numeric results after measurements on semiconductors, optical devices, active components, and passive components.

Multi-Channel IV Characterization Solution

Multi-channel IV characterization requires synchronized source-measure channels, sweep and sampling control, and immediate review of current and voltage behaviors across static and dynamic measurements. The Keysight solution combines the PZ2100 Series high-channel-density precision source measure (SMU) unit platform with PW9251A PathWave IV Curve Measurement Software to support synchronous IV sweeps, step-response measurements, and pulsed waveform capture. The configuration supports up to 20 source measure unit channels, preview timing verification, graph and table analysis, digitizer-based pulsed measurements, and seamless ranging for wider dynamic range. Together, these capabilities help engineers execute complex IV measurements without custom programming, and quickly review results.

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Explore Products for Our Multi-Channel IV Characterization Solution

PW9251A PathWave IV Curve Measurement Software

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PZ2100A High-Density Precision SMU Mainframe (4 slots, 1U)

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