MIMO Measurement Tips with Power Meter & USB Power Sensor

This document walk you through steps to perform accurate and repeatable MIMO power measurements Keysight power measurement solutions. Learn more

1 µs IV Characterization of Flash Memory Cells Using the B1530A Semiconductor Device Analyzer

Why do flash memory cells require high speed IV characterization? Learn why and how to use the B1530A for 1us IV Characterization of flash memory cell testing.

Reliable Satellite Testing and Remote Monitoring

Power measurements are critical for conducting satellite tests. Learn how to perform long-term remote monitoring of satellites with USB power sensors.

Non-Contact Measurement for 13.56 MHz RFIDs

This document gives an overview of how to perform non-contact measurements of the resonant frequencies of 13.56 MHz RFID tags. Learn more!

Jitter Solutions for Telecom, Enterprise, and Digital Designs

This brochure combines ""Jitter Solutions for Digital Circuits"" and ""Need to test jitter?"" brochures. It addresses Keysight's jitter solutions for telecom, enterprise, and digital applications. (Replaces 5988-8427EN & 5988-7051EN). This brochure will let the customer determine which Keysight solutions will meet their design/test needs.

7 Reasons to Upgrade to ENA Network Analyzers from the 8753

This document helps 8753x users understand how the ENA network analyzer can improve their network measurement environment, especially RF component test applications.

Using Low-Cost Instruments for Teaching Modulation

Get essential product information and the top 3 reasons why Keysight low cost instruments are great for customer education when teaching modulation.

Real-Time Spectrum Analysis for 802.11n/ac Device Troubleshooting

Learn how real-time spectrum analysis helps identify RF interference and WLAN signals that can impact the performance of 802.11n/ac devices.

DDR and DDR2 – Debugging Intermittent Memory Failures

Learn how to validate and debug high-speed memory systems and find root cause of intermittent memory failures in DDR and DDR2 systems.

Customizing the B2900A SMU’s Default Boot-Up Settings

This application brief explains the "Power-On State" function and shows how to customize the instrument boot-up default in current source mode.

Overcoming LTE Advanced RF Test Challenges

This application note covers test implications for recent LTE-A updates. Learn how the multi-touch MXA X-Series Signal Analyzer simplifies LTE / LTE-A test.

Thyristor Characterization Using B1505A Power Device Analyzer

Read this overview of thyristor characterization using the B1505A. Discontinuous behavior requires different methodologies for testing thyristor’s DC parameters.

Battery LIfe Challenges in IoT Wireless Sensors and the Implication for Test

This application note discusses battery life challenges in IoT wireless sensors and the implications of test.

STAr Sagi-MDR: Multi-Die Reliability (MDR) Test Solution

STAr Sagi offers a flexible solution for reliability test. Find out how to build up a parallel MDR reliability test solution base on time and on budget.

Accounting for Antenna and MIMO Channel Effects

Learn how SystemVue predicts the effects of propagation and physical imperfections of MIMO antennas on system performance without hardware prototypes.

Precision ADC Evaluation Using a Low Noise DC Source

Learn the importance of, and the requirements for, low-noise DC signal sources for precision ADC evaluation. Keysight’s B2961A/62A is well-suited for this application.

Diode Production Test Using the B2900A Series of SMUs

This application note shows how to use the Keysight B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test.

Testing Frequency-Hopping Spread Spectrum Devices

Learn how to test frequency-hopping spread spectrum devices using a simulation system with a signal generator, arbitrary waveform generator and MATLAB.

Generate Looped Test Patterns or PRBS Signals with a Preamble

This paper explains how to setup a looped test pattern with a preamble, played once, to bring the tested device into a test mode to test for errors.

Characterizing CAN Bus Arbitration Using Oscilloscopes

Read about the CAN bus arbitration process and techniques to characterize the physical layer of the differential CAN bus for automotive system debug using a scope.