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Detect, localize, and mitigate side-channel leakage before tape-out. Inspector SC2 Pre-Silicon Side-Channel Analysis enables hardware security, design, and verification teams to identify side-channel vulnerabilities during design phase and development, before silicon is manufactured (pre-silicon). While traditional post-silicon testing can determine whether leakage exists in a fabricated device, Inspector provides visibility into where leakage originates within the design, helping teams identify the root cause and evaluate mitigation strategies earlier in the development lifecycle. By analyzing register-transfer level (RTL), synthesized netlist, and gate-level designs using simulation test vectors and Value Change Dump (VCD) files, Inspector SC2 Pre-Silicon Side-Channel Analysis identifies which signals leak, how much they leak, when leakage occurs, and where it originates within the design. This visibility enables teams to validate countermeasures, compare design alternatives, and reduce the cost and risk of discovering vulnerabilities after fabrication.
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Inspector SC2 Pre-Silicon Side-Channel Analysis helps semiconductor teams detect and analyze side-channel leakage before tape-out, when design changes are faster, less costly, and easier to implement.
Using simulation test vectors, VCD activity files, and optional power models generated through existing electronic design automation (EDA) workflows, Inspector analyzes RTL, synthesized netlist, and gate-level designs to identify leakage, measure its severity, and pinpoint the signals and modules responsible. By providing actionable root-cause analysis, teams can validate countermeasures, compare implementation options, detect leakage introduced during synthesis and optimization, and reduce post-silicon security risk.
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