How to Characterize ADC and VCO Performance

Pro Benchtop DC Power Supply
+ Pro Benchtop DC Power Supply

Precision Power for Mixed-Signal Testing

High-resolution Analog-to-Digital Converters (ADCs) and sensitive Voltage-Controlled Oscillator (VCO) circuits require extremely low-noise and highly stable power sources to achieve accurate performance characterization. Traditional test setups often involve multiple instruments, complex synchronization, and significant averaging to mitigate noise, increasing both cost and test complexity.

Modern low-noise power sources with integrated measurement capabilities simplify these workflows by combining precision sourcing, waveform generation, and measurement in a single instrument. This enables efficient evaluation of ADC linearity (DNL/INL) and VCO phase noise while reducing setup complexity and improving measurement repeatability.

ADC and VCO Characterization Solution

The ADC linearity and VCO phase noise characterization workflow requires applying highly stable, low-noise voltage or current to the device under test while simultaneously monitoring its response. The solution uses a precision low-noise power source with integrated measurement capability to deliver accurate sourcing and real-time measurement, ensuring repeatable and high-integrity test results. The Keysight B2962C Pro Benchtop DC Power Supplies provides high-resolution voltage and current output with ultra-low noise performance, enabling clean biasing for sensitive analog and RF devices. Its built-in measurement functions eliminate the need for separate instruments, simplifying the test setup and reducing synchronization complexity. Integrated filtering further suppresses output noise, minimizing interference during measurements such as ADC linearity sweeps and voltage-controlled oscillator phase noise evaluation. This architecture supports combined sourcing and measurement in a single instrument, improving efficiency, reducing setup time, and enabling consistent, repeatable characterization in advanced electronic test environments.

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