Webinar
As 6G, high-resolution radar, and integrated sensing applications move into the sub-THz frequency range, accurate on-wafer noise figure (NF) characterization becomes increasingly critical.
This webinar explores the cold-source NF method as a practical approach for measurements beyond 100 GHz, covering measurement principles, calibration techniques, uncertainty considerations, and best practices for achieving repeatable, traceable results without high-ENR noise sources
RF Test engineers, Production Test engineers
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