Driving Confidence In
Automotive Electronic Testing

In today's automotive industry, ensuring the reliability of electronic components is mission-critical. From complex ECUs to simple wiper sensor boards and anti-collision sensors, these electronics are the lifeblood of modern vehicles, impacting safety, efficiency, and overall functionality.

Our in-circuit test product portfolio includes a wide range of board test solutions designed to meet the diverse needs of the automotive electronics testing landscape. Take our latest i3070 Series 7i, for example. This industry-leading system now includes specialized features explicitly tailored for automotive testing. These features encompass supercapacitor testing, faster shorts testing, LED diagnostics, and low-current measurements – all crucial tests required to test automotive electronics such as engines, transmission or safety electronics, and entertainment systems. With the i3070 Series 7i, you can enjoy peace of mind knowing that your automotive electronics will undergo comprehensive and reliable testing.

For those handling high-volume, low-complexity boards like anti-collision sensors and wiper boards, our award-winning i7090 offers a breakthrough solution. With the ability to simultaneously perform massively parallel board tests on up to 20 boards efficiently and accurately, testing these small electronic boards is now more cost-effective to enable better test coverage and reliability. 

But we don't stop there. To further enhance your testing capabilities, we introduce the x1149 2.0. This state-of-the-art system, compliant with the latest IEEE standards, can be integrated with the i3070 or used as a standalone solution. Ensure confidence in the quality of your shipped automotive electronics by recovering test coverage of mission-critical ICs lost due to the limited access to electronic nodes.

Ready to explore our solutions? Find the board test solution that's right for you below, or talk to our specialists today for a tailored solution to your automotive electronic testing needs.

Award-Winning Board Test Solutions

Explore our award-winning board test solutions, recognized for their innovation and superior performance. Find out why industry experts and customers alike choose us for cutting-edge technology and unparalleled quality.

Keysight i7090 Massively Parallel Board Test System

World’s first massively parallel board test system that supports up to 20 cores to perform tests in parallel on multiple printed circuit board assemblies (PCBAs). Engineers can simultaneously test multiple Units Under Test (UUTs) without requiring multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space. Additionally, it comes with an FCT rack and test resource for FCT expansion and a new 129-node hybrid card for digital text expansion.

Keysight x1149 2.0 Boundary Scan Analyzer

Keysight's x1149 Boundary Scan Analyzer is a powerful tool for structural tests, such as open and short tests on their PCBAs. It also performs In-System Programming for devices such as Field Programmable Gate Array (FPGAs) and Complex Programmable Logic Devices (CPLDs). for testing interconnects between ICs, eliminating the need for physical probes. The latest x1149 2.0 Boundary Scan Analyzer complies with the IEEE 1149.1-2013 standard and unlocks new testing capabilities, including register mnemonic, IC reset control, power domain support, and more.

VA Award 2022 Plaque
SbS Excellence Gold Award

Find The Board Test Solution That's Right For You

In-circuit Test > i3070 Systems

In-circuit Test > i3070 Systems

Keysight i3070 In-Circuit Test (ICT) Systems is the world's most proven ICT System which enable 20% more output with unparalleled test coverage and robustness.

Automated ICT Systems

Automated ICT Systems

Keysight i1000 in-circuit test (ICT) system is a low-cost in-circuit test solution that comes with digital testing capabilities.

i7090 Massively Parallel Board Test System

i7090 Massively Parallel Board Test System

The i7090 Board Test System is the world's first massively parallel board test system with up to 20 cores for parallel board testing on multiple PCBAs.

nanoVTEP Vectorless Test Applications

nanoVTEP Vectorless Test Applications

Keysight Vectorless test solution has a miniaturized amplifier to help improve test coverage. Less on-floor space required with 60% smaller footprint.

x1149 Boundary Scan Analyzer

x1149 Boundary Scan Analyzer

New x1149 Boundary Scan Analyzer is a tool for electrical structural tests with a powerful boundary scan from JTAG Technologies, based on IEEE 1149.x standards.

i1000 In-Circuit Test Systems

i1000 In-Circuit Test Systems

Keysight i1000 in-circuit test (ICT) system is a low-cost in-circuit test fixture solution that comes with digital testing capabilities.

3070AF ICT i3070 Accessories

3070AF ICT i3070 Accessories

View i3070 ICT test fixture accessories ranging from fixture kits to vectorless test items and select items/parts to request for a Quick Quote conveniently.

Utility Card: Flash Programming Applications

Utility Card: Flash Programming Applications

Enable In-System Flash Programming (ISP), LED Testing, and Boundary Scan Solutions with the Keysight utility card.

System Uptime Support Services

System Uptime Support Services

Professional, localized uptime support and end-to-end services that address real-world manufacturing challenges.

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Extend Your Capabilities With The Right Tools

The Keysight Board test system software is feature-rich and explicitly designed for PCBA Manufacturing Test. These tools ensure the success of Boundary Scan testing at all stages of the product life cycle, from design to prototyping, NPI, and high volume production runs.

DFT Analysis Tool

DFT analysis tool is available as part of the x1149 SW. This tool provides insights into how well the DFT on the PCBA is performing in terms of ensuring high test coverage. Below is the link to the software application.

Keysight x1149 Boundary Scan Analyzer Software Release

ICT Software

ICT is the most commonly used board manufacturing test in the manufacturing production line. To see what kind of test coverage you can get, click on the link below to download the i3070 ICT Software.

Keysight i3070 Software Release

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Featured Resources

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Frequently Asked Questions About In-Circuit Test (ICT)

What is an in-circuit test?

In-circuit testing (ICT) is a critical performance and quality assessment method for printed circuit boards (PCBs). ICT is instrumental in detecting manufacturing faults such as short circuits, open circuits, irregular resistance, unexpected capacitance, and other discrepancies that could potentially hinder the optimal functioning of the final electronic product. Among the various PCB testing methods, ICT provides crucial testing capabilities that help manufacturers verify the functionality of their components and units, ensuring alignment with product specifications and capabilities.

What is boundary scan testing?

Boundary scan testing, or Joint Test Action Group (JTAG) testing, is critical in electronic design and manufacturing. Boundary scans enable the functional examination of digital components, including integrated circuits (ICs), FPGAs (field-programmable gate arrays), and PCBs. The boundary scan process applies test patterns and observes corresponding responses, effectively pinpointing faults, short circuits, open circuits, and other potential defects.

What is in-circuit test coverage?

ICT coverage represents the percentage of components and circuitry that an in-circuit test system can effectively test on a PCB. Higher coverage ensures a more comprehensive evaluation of the board's integrity and functionality.

What are the advantages of in-circuit testing?

The advantages of in-circuit testing include pinpointing faults at the component level, conducting simultaneous testing across multiple points, and swiftly and accurately evaluating intricate PCBs.

What is the purpose of in-circuit testing (ICT) in electronic manufacturing?

In-circuit testing in electronic manufacturing aims to detect defects or faults in individual electronic components or circuits during the production process.

How does in-circuit testing differ from functional testing in electronics?

In-circuit testing distinguishes itself from functional testing by concentrating on verifying the integrity and connectivity of individual components and circuits. In contrast, functional testing evaluates the overall performance of the electronic device.

What types of defects or issues can in-circuit testing identify?

In-circuit testing in electronic manufacturing aims to detect defects or faults in individual electronic components or circuits during the production process. In-circuit testing can identify defects such as incorrect component values verification, soldering defects, open circuits, short circuits, incorrect component placement, polarity issues, incorrect orientation, missing components, component misalignment, defective components, and faulty connections.

What are the main advantages of using in-circuit testing in quality control?

The main advantages of using in-circuit testing in quality control include early detection of defects, high test coverage, fast testing speeds, and the ability to perform tests on complex electronic assemblies.

How is in-circuit testing performed on printed circuit boards (PCBs)?

In-circuit testing on PCBs is typically performed using specialized test fixtures or bed-of-nails testers to make electrical connections with specific points on the board, after which test signals and measurements can be applied.

How does in-circuit testing contribute to the overall production efficiency?

In-circuit testing contributes to overall production efficiency by enabling rapid fault detection, reducing rework and scrap, and ensuring the reliability and quality of electronic products.

How is in-circuit testing adapted for different types of electronic components?

In-circuit testing can be adapted for different types of electronic components by using specialized test probes, fixtures, and test algorithms tailored to the specific characteristics of each component.

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