How to Generate Double Pulse Signal for Power Devices

Get Quote
Waveform and Function Generator
+ Waveform and Function Generator
Waveform and Function Generator
+ Waveform and Function Generator

Analyze switching behavior in power devices

The double-pulse test method for evaluating the dynamic switching performance of power semiconductor devices applies two sequential gate pulses to the device under test while capturing voltage and current waveforms to analyze switching losses, voltage overshoots, diode recovery behavior, and current and voltage slew rates. The first pulse brings the circuit to a steady operating state by energizing the load inductor, followed by a recovery period and a second pulse that captures the device’s switching characteristics.

To perform the test, engineers can use a function generator to create the pulse signal and an oscilloscope to observe the resulting waveforms. Proper configuration of the pulse timing and signal shape is essential to avoid measurement distortion or device damage. A high-bandwidth oscilloscope and appropriate probes are needed to accurately capture the transient behavior, enabling analysis of key parameters such as Eon, Eoff, delay times, and transition slopes that directly affect power efficiency and thermal management.

Double pulse signal generation and characterization

Applying a double pulse signal to power semiconductor devices requires precision waveform generation, flexible pulse control, and high-resolution measurement. The Keysight Smart Bench Essentials Plus function / waveform generator delivers high signal fidelity with Trueform waveform technology, 16-bit arbitrary waveform generation, and up to 100 MHz bandwidth. It works seamlessly with BenchLink Waveform Builder Pro software to design and import custom pulse profiles. The Smart Bench Essentials Plus HD3 oscilloscope complements this setup with 14-bit vertical resolution, built-in waveform analysis tools, and a low noise floor to capture detailed switching transients. Together, this solution enables engineers to evaluate turn-on and turn-off losses, switching speed, and overshoot behavior with clarity and repeatability.
Get Quote

See demo of double pulse generation

Explore products in our double pulse generation solution

Related use cases

How to Perform Flash Programming with In-Circuit Test (ICT) System

Integrating in-system programming (ISP) into an ICT test system requires necessary hardware interface and software tools to communicate with target devices. Learn how the integrated ISP solution for ICT enhances the efficiency and flexibility of the manufacturing and testing processes.

Learn more

How to Measure DC Inrush Current

Measuring DC inrush current requires an accurate, high-speed current signal digitizer. Learn how to make these measurements using a simple and easy method with a digital multimeter.

Learn more

Burn-in and Reliability Stress Test Solution

Learn how to ATE system power supply, combined with the automated power suite, provides a modern, energy-efficient approach to burn-in and reliability stress testing.

Learn more

contact us logo

Get in touch with one of our experts

Need help finding the right solution for you?

Contact Us