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Accelerate Advanced Package & 3DIC Designs
Design, model, and validate complex 3D interconnect architectures with a powerful standalone design environment.
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Scale AI Compute. Simplify Validation.
Automate transmitter and receiver validation across next-generation I/O, memory, and fabric interfaces.
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End-to-End Validation for AI Data Center
Strengthen 1.6T network reliability for AI-scale workloads from transceivers to interconnects.
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Take On Complex MIMO Signals
Pair Keysight VSA software with the new XA5 signal analyzer for advanced visualization, demodulation, and analysis — start your 30-day trial today.
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Introducing AI-Enhanced Packet Brokers
With extra memory and storage, these enhanced NPBs run Keysight's AI security and performance monitoring software and AI stack.
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Accelerate Semiconductor Innovation
Explore end-to-end workflows spanning IC design, validation, wafer test, and photonics.
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448 Gb/s Waveform Generation
Achieve 200+ Gbaud multi-level modulated signals with high-speed AWGs for digital and optical standards.
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The Right Connection Makes the Measurement
Maximize accuracy and performance with precision accessories engineered for Keysight instruments.
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Scale to Hundreds of Channels. Keep Measurements in Sync.Four channels per 1U of rack space, up to 1 GHz bandwidth, and multi-oscilloscope synchronization.
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Accessories
Explore the complete portfolio of Keysight accessories designed to complement and extend your instruments. Use the filters below to quickly find compatible accessories such as modules, cables, adapters, and other system components to configure, expand, and optimize your test system for your specific measurement needs.
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InfiniiMax Ultra Probe Amplifier, 25 GHz
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
InfiniiMax Ultra Probe Amplifier, 25 GHz
MX0025A
Best probes for measuring signals found in the latest DDR5 and MIPI standards.
- Test and validate high-speed technologies such as DDR5 / MIPI with the 25 GHz probe amplifier (AP2).
- Experience the highest input impedance in midband frequencies for low-energy probing.
- Boost test margins with the lowest signal degradation.
- Probe small devices with the super-flexible micro probe head or choose from the widest variety of compatible probe heads for your unique application.
- Measure differential, single-ended, and common mode signals with a single probe tip.
- Use with Infiniium UXR-, 90000 X-, Q-, V-, and Z-Series oscilloscopes.
Keysight’s MX0025A InfiniiMax Ultra Series probe amplifier improves usability because you can measure differential, single-ended, and common mode signals with a single probe tip.
When you use a probe to connect your signal to your oscilloscope, it becomes part of the circuit affecting your test. Your probe may be hiding signal details, loading down your signal, or distorting it. InfiniiMax Ultra Series probes have the lowest loading for minimal impact to your circuit. Boost your test margins and gain measurement confidence with their unprecedented accuracy. Ensure your entire measurement system is helping you see the truest representation of your signal.
These probes have the lowest noise and capacitive loading and the lowest loading across more frequencies due to their RC high impedance profile. The InfiniiMax Ultra Series supports InfiniiMode and has a user-defined AC calibration mode, a wider input voltage range, more accuracy with unique S-parameter characterization, lower capacitive loading, a wider input voltage range, micro / socketed probe heads for smaller density probing, and more bandwidths. The InfiniiMax Ultra Series has an RC input impedance architecture with the lowest loading and least signal distortion across the widest frequency range.
InfiniiMax Ultra probes have three attenuation ranges — 1:1, 4:1, and 8:1 — giving you superior noise performance and large voltage ranges, all while maintaining maximum bandwidth. The input range automatically configures depending on the size of the input signal and vertical scale of your oscilloscope.
Choose from the three flexible input dynamic ranges from 600 mVpp at 1:1, 2.5 Vpp at 4:1, and 5 Vpp at 8:1. Clearly see and know when your design is satisfactory, keep up with standards, easily probe small devices, and reduce test complexity with the InfiniiMax Ultra Series probes.
1310 nm Single Mode Side Channel Laser Source
Perform side-channel measurements with this 1310 nm single-mode continuous wave diode laser.
Perform side-channel measurements with this 1310 nm single-mode continuous wave diode laser.
1310 nm Single Mode Side Channel Laser Source
DS1210A
Perform side-channel measurements with this 1310 nm single-mode continuous wave diode laser.
The DS1210A is a continuous-wave laser source with very precise power output. Use it for side-channel measurements based on failure analysis methodologies applied for side channel analysis.
- 1310 nm continuous-wave laser
- Single mode
- 500 mw
- Long-life laser diode for minimal aging
- Choose from coarse to detailed chip surface scanning with a 100:1 spot size range
- Use with DS1101A Fault Injection Laser System and DS1102A Dual Laser Fault Injection System
- Control optical power with DS1160A Smartcard Voltage and Clock Glitcher or DS1180A Glitch Pattern Generator
1425 nm Single Mode Side Channel Laser Source
Perform side-channel measurements with this 1425 nm single-mode continuous wave diode laser.
Perform side-channel measurements with this 1425 nm single-mode continuous wave diode laser.
1425 nm Single Mode Side Channel Laser Source
DS1211A
Perform side-channel measurements with this 1425 nm single-mode continuous wave diode laser.
The DS1211A is a continuous-wave laser source with very precise power output. Use it for side-channel measurements based on failure analysis methodologies applied for side channel analysis.
- 1425 nm continuous-wave laser
- Single mode
- 500 mw
- Long-life laser diode for minimal aging
- Choose from coarse to detailed chip surface scanning with a 100:1 spot size range
- Use with DS1101A Fault Injection Laser System and DS1102A Dual Laser Fault Injection System
- Control optical power with DS1160A Smartcard Voltage and Clock Glitcher or DS1180A Glitch Pattern Generator
Fault Injection Laser System
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
Fault Injection Laser System
DS1101A
The DS1101A Fault Injection Laser System is an upgraded optical solution for the next generation of fault injection attacks.
Protecting chips against laser fault attacks is one of the main security challenges in the smart card industry. With the DS1101A Fault Injection Laser System, perform advanced laser fault attacks that meet the highest international standards to assess if a smart card is secured against laser attacks. The DS1101A offers a set of new features meeting the latest timing and power requests from fault injection experts around the world. The special set of lasers with dedicated optics and ultra-fast and flexible control create the ultimate fault injection test solution. Its integration with the Inspector software further ensures that automation and analysis are covered by extendible modules which are flexible and easy to use.
- Supports front- and back-side attacks
- Integration with Inspector’s software and fault analysis modules
- Zoomable camera for easy navigation and automated Z-axis
- Fast multi-time glitching and accurate digital scaling with fast and predictable response to trigger pulse
- Multi-spot and IR navigation upgrades available
- Automatic scanning of a chip’s surface with integrated motorized XYZ stage
- Camera inspection of laser spot and location on chip area
- High repetition accuracy on motorized axes
- SDK available for integration into custom setups
445 nm Multimode Fault Injection Laser
The DS1110A is a 445 nm wavelength blue multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1110A is a 445 nm wavelength blue multimode diode laser for fault injection, with a high power rating and configurable pulse length.
445 nm Multimode Fault Injection Laser
DS1110A
The DS1110A is a 445 nm wavelength blue multimode diode laser for fault injection, with a high power rating and configurable pulse length.
The DS1110A 445 nm Multimode Fault Injection Laser uses multimode laser diodes with a high power rating, enabling coarse chip surface scanning with large spot size and sufficient intensity within spot.
- 445 nm wavelength blue laser
- Laser pulse power: 3 W
- Configurable pulse length as small as 2 ns
- High pulse frequency allows multi-pulse fault injection attacks
- Short delay between trigger pulse and actual light pulse in combination with minimal jitter allows for accurate laser pulse timing
- Wide range of spot size: Choose from coarse to detailed chip surface scanning with objectives and spot size reducer
- Long-life laser diode with minimal aging
- Integrates with Keysight products DS1101A, DS1102A, DS1160A, and DS1180A
Automotive Security Test Tool
Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios.
Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios.
Automotive Security Test Tool
DS1170A
Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios.
Pinpoint vulnerabilities and improve security for electronic circuits in vehicles using the Keysight DS1170 automotive security test tool. Developers can easily integrate the tool in their existing test bench to execute predefined attack scenarios and establish a security baseline for either a specific electronic control unit (ECU) or a combination of ECUs. Accompanying software streamlines control of the automotive security test tool and interpretation of results. Optimize your security setup with the ability to control multiple DS1170 automotive security test tools with one dashboard and share information between them.
Complexity in cars is increasing constantly. While the increase in electronic units in vehicles allows for a better driver experience, it also increases the number of points an attacker can exploit. By adding the DS1170 to your vehicle security development testing, you can increase security measures and stay ahead of threats. Keysight’s protocol agnostic automotive security testing tool offers an all-in-one option for multiple security test scenarios. It offers the following features:
- Standard connectors to easily integrate the tool in your existing test bench
- Ability to record and replay control area network (CAN) messages to emulate an ECU
- Automated fuzzing capabilities to test the robustness of any ECU
- Traffic-driven triggering capabilities to extend your test scenarios with side channel analysis (SCA) and fault injection (FI)
- Prepared for ISO 21434
- Smart, active bus scanning in the discovery phase to record traffic
- Access to all low-level functions used in the predefined test scenarios to help you compose your own scenario
- Ability to analyze bus traffic in real-time and manipulate messages
- Use python or command-line for scripts
Hardware Crypto Training Target
The DS1031A Hardware Crypto Training Target is a training target and development/prototyping board for side channel analysis and fault injection.
The DS1031A Hardware Crypto Training Target is a training target and development/prototyping board for side channel analysis and fault injection.
Hardware Crypto Training Target
DS1031A
The DS1031A Hardware Crypto Training Target is a training target and development/prototyping board for side channel analysis and fault injection.
The DS1031A Hardware Crypto Training Target is a development board based on an ARM Cortex-M4F core working at a 168MHz clock speed. It has been physically modified and programmed to act as a training target for side channel analysis (SCA) and fault injection (FI) attacks. The source code and integrated development environment (IDE) provided with the target allow it to also be used for development and prototyping.
- Challenging training target for both passive SCA attacks like differential power analysis (DPA) and active FI attacks like differential fault analysis (DFA)
- Accurately models current 32-bit embedded devices; HW crypto is implemented similar to current devices
- Stable behavior; robust against accidental permanent damage from FI
- Configurable countermeasures
Software Crypto Training Target
The DS1030A Software Crypto Training Target is a training target and development/prototyping board for side channel analysis and fault injection.
The DS1030A Software Crypto Training Target is a training target and development/prototyping board for side channel analysis and fault injection.
Software Crypto Training Target
DS1030A
The DS1030A Software Crypto Training Target is a training target and development/prototyping board for side channel analysis and fault injection.
The DS1030A Software Crypto Training Target is a development board based on an ARM Cortex-M4F core working at a 168MHz clock speed. It has been physically modified and programmed to act as a training target for side channel analysis (SCA) and fault injection (FI) attacks. It may also be used for development and prototyping, thanks to the provided source code and integrated development environment (IDE).
- Challenging training target for both active FI attacks like differential fault analysis (DFA) and passive SCA attacks like differential power analysis (DPA)
- Accurately models current 32-bit embedded devices; HW crypto is implemented similar to current devices
- Stable behavior; robust against accidental permanent damage from FI
- Configurable countermeasures
Gauge kit, 1.0 mm Connector
The 85059G 1.0 mm gauge kit provides a pair of mechanical connector gauges and set masters to inspect the pin depth of 1.0 mm male and female connectors of DUTs, test accessories, and the calibration standards in the 85059B calibration kit and 85059V verification kit.
The 85059G 1.0 mm gauge kit provides a pair of mechanical connector gauges and set masters to inspect the pin depth of 1.0 mm male and female connectors of DUTs, test accessories, and the calibration standards in the 85059B calibration kit and 85059V verification kit.
Gauge kit, 1.0 mm Connector
85059G
The 85059G 1.0 mm gauge kit provides a pair of mechanical connector gauges and set masters to inspect the pin depth of 1.0 mm male and female connectors of DUTs, test accessories, and the calibration standards in the 85059B calibration kit and 85059V verification kit.
The 85059G gauge kit contains both a male gauge and a female gauge to cover both genders of 1.0 mm connectors. Each gauge has a precision plunger and digital indicator that measures connector pin depth and is accompanied by its own master standard to zero/calibrate the gauge. These gauges allow you to measure and monitor center conductor protrusion or recession of 1.0 mm connectors of calibration standards, adapters, verification standards, and instrument test ports to maintain high measurement accuracy and repeatability. The gauges provide a k=2 measurement uncertainty of ±0.0002 inches or ±0.0040 mm.
Frequency Extender, 250 GHz
NA5307A Frequency extenders with 0.5 mm coaxial test port connector enable you to configure a millimeter-wave single-sweep broadband VNA to measure S-parameters up to 250 GHz using the N522x/4xB PNA/PNA-X Microwave network analyzer and the N5292A Test set controller.
NA5307A Frequency extenders with 0.5 mm coaxial test port connector enable you to configure a millimeter-wave single-sweep broadband VNA to measure S-parameters up to 250 GHz using the N522x/4xB PNA/PNA-X Microwave network analyzer and the N5292A Test set controller.
Frequency Extender, 250 GHz
NA5307A
NA5307A Frequency extenders with 0.5 mm coaxial test port connector enable you to configure a millimeter-wave single-sweep broadband VNA to measure S-parameters up to 250 GHz using the N522x/4xB PNA/PNA-X Microwave network analyzer and the N5292A Test set controller.
The N522xB PNA/N524xB PNA-X network analyzer with the N5292A test set controller and the NA5307A 250 GHz frequency extenders provides fully calibrated broadband, single-sweep S-parameter measurements from 100 kHz/10 MHz to 250 GHz.
The NA5307A frequency extender is equipped with a ruggedized a 0.5 mm coaxial male test port connector. It is a compact and lightweight module that is driven and controlled with a PNA/PNA-X network analyzer and a P9500A frequency extender hub via USB.
The broadband VNA measurement setup can be accurately calibrated with the 85065A 0.5 mm coaxial precision calibration kit, which includes 16 calibration standards within the entire frequency range.
- Single-sweep broadband S-parameter measurement from 100 kHz/10 MHz to 250 GHz
- Built-in bias tee
- Built-in 1.2 m or 1.8 m interface cable
- 4-port configuration for 2-port differential measurement
- 85065A 0.5 mm precision mechanical calibration kit up to 250 GHz
- ≥ 0 dBm output power up to 170 GHz
- System dynamic range
≥ 110 dB for 20 GHz to 170 GHz
≥ 105 dB for 170 GHz to 220 GHz
≥ 75 dB for 220 GHz to 250 GHz
- 0.1 dB receiver compression @ +10 dBm
B2900 Series SMUs Accessories
Includes several optional accessories for the B2900 series such as interlock cables and GPIO-to-BNC trigger adapters
Includes several optional accessories for the B2900 series such as interlock cables and GPIO-to-BNC trigger adapters
B2900 Series SMUs Accessories
N1294A
Includes several optional accessories for the B2900 series such as interlock cables and GPIO-to-BNC trigger adapters
The Keysight N1294A offers several optional accessories for the B2900 family, including the B2900A, B2900B, and B2900C Series. Choose the appropriate accessory based on your application:
- N1294A-011 and N1294A-012: Interlock cables for the 16442A/B test fixture.
- N1294A-031: GPIO-to-BNC trigger adapter for synchronization with other instruments.
- N1294A-032: Digital I/O trigger cable for use with EasyEXPERT group+ software and multiple compatible B2900 Series SMUs.
For more information about Precision Source Measure Unit (SMU), please visit Keysight B2900 Series Precision Source/Measure Unit (SMU).
Stream Processing Unit for N9048B EMI Receiver
Accelerate the Time Domain Scan speed (up to 1 GHz bandwidth) for EMI compliant measurements.
Accelerate the Time Domain Scan speed (up to 1 GHz bandwidth) for EMI compliant measurements.
Stream Processing Unit for N9048B EMI Receiver
N9048BSPU
Accelerate the Time Domain Scan speed (up to 1 GHz bandwidth) for EMI compliant measurements.
The N9048BSPU stream processing unit extends the Time Domain Scan (TDS) bandwidth of the N9048B PXE EMI receiver to 1 GHz, shortening traditional test cycles from hours to mere seconds.
Execute full CISPR Band C and D measurements (30 MHz to 1 GHz) in one acquisition, eliminating the need for multiple scans and data stitching.
Utilize 1 GHz Real-Time Scan (RTS) with integrated CISPR detectors to ensure the capture of elusive, transient, or intermittent emissions.
Leverage a high-performance FPGA and GPU architecture to accelerate data transfer and signal processing in real-time.
Support continuous, high-bandwidth IQ data streaming via the Optical Data Interface (ODI).
