Millimeter-wave (mmwave) Signal Analysis Optimization

Learn about a cost-effective solution for mmwave signal analysis. Keysight’s X-Series signal analyzers can help optimize millimeter wave performance measurements.

x1149 Boundary Scan Solution for Blade Server Board

Keysight’s x1149 offers great flexibility for boundary scan. See how the multi-chain feature helps you achieve boundary scan interconnection easily.

Frequency Agile Complex Signal Simulation with AWGs

Learn how the M8190A AWG generates precise test signals for complex signal simulation and system test with frequency agility and long playtime features.

Accelerate Vehicle Charging System Simulation

The N6705A DC Power Analyzer provides a flexible and easy way to simulate vehicle charging system power waveforms for R&D electrical component testing. Learn more.

Installation and Maintenance of Solar Photovoltaic Systems

See how Keysight handheld solutions for solar photovoltaic systems meet all your solar power installation and maintenance test needs.

Characterization Efficiency with B2900’s Easy File Access

This application brief introduces convenient function to manage files on the B2900 precision instrument family via Windows Explorer called Easy File Access.

Making Component Matching Measurements in IC Design

This application note addresses the issue of component matching and explains how to use Keysight parametric test systems to make component matching measurements.

A Source/Measurement Unit Based Teaching Lab Solution Package for MEMS Technologies

This 2-page introduces the Keysight B2902A/12A Source/Measure Unit based Teaching Lab Solution Package for MEMS Technologies

Power Supply Connections for CET Signal Conditioner Card

The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Accelerate Debug and Evaluation of IoT Devices by Current Profile Analysis

You can solve the IoT device development challenges and dramatically improve the development efficiency and quality with current profile measurement with a Device Current Waveform Analyzer.

DVB-T and DVB-T2 Transmitter Test Challenges

This paper helps you understand DVB-T and DVB-T2 standards, and how to address challenges of DVB-T and DVB-T2 transmitter testing using correct test methods.

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test

This application note discussed several features of the Keysight N6700 series modular power system which are ideally suited for sequencing and ramping multiple bias voltages during test.

Decoding NFC-F Based on Manchester-encoded ASK Modulation

Step-by-step instructions on how to setup oscilloscopes to decode and trigger on NFC-F poller and listener communication for Manchester encoded ASK modulation.

Functional Assisted GPS Receiver Testing

Learn to perform assisted GPS receiver testing using the 8960 Wireless Communication Test Set with a Vector Signal Generator and GPS Personality in cellular devices.

Addressing DC Power Test Challenges for Base Station Subassemblies

How to address DC power test challenges during development and production test of base station subassemblies using DC power analyzers and modular power system.

Correlating Microwave Measurements between Benchtop and Handheld Analyzers

Learn about Keysight’s new handheld analyzers and microwave measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Characterization of LTE Devices Made Simple

See how easy it is to characterize LTE devices using MXA signal analyzers with a touchscreen UI that includes drop down menus to speed up LTE design testing.

Conducting Site Surveys Using Handheld Spectrum Analyzers

Learn how conducting site surveys is made easy by using the N934xC handheld spectrum analyzer with site survey tools like signal strength mapping and new GPS capability.

LTE-Advanced Manufacturing Test

This application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Using the Graphical Pin Locator on Medalist ICT Systems

The graphical locator tool on the Keysight Medalist In-Circuit Test (ICT) System is an improvement over the old “Find Pins” tool. Give it a try!