How to Accelerate NVM Device Development

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Device Current Analyzer
+ Device Current Analyzer
Device Current Analyzer
+ Device Current Analyzer

Understanding NVM Switching Behavior

Emerging non-volatile memory (NVM) technologies such as PCRAM, MRAM, and RRAM require precise characterization of transient switching behavior to improve performance, reliability, and scalability. These devices rely on fast Set/Reset pulses, often below 100 ns, making accurate current waveform measurement critical for development.

Engineers must capture both fast transient current and long-term reliability behavior across millions of switching cycles. Traditional measurement approaches lack sufficient bandwidth, dynamic range, and memory depth, limiting the ability to analyze these complex behaviors effectively.

NVM Transient Analysis and Development Solution

Capturing fast transient current behavior in advanced semiconductor devices requires high-bandwidth measurement and precise timing control to accurately observe switching dynamics. The Keysight CX3324A Device Current Waveform Analyzer provides up to 200 MHz bandwidth and 1 gigasample per second (GSa/s) sampling, enabling detailed visualization of rapid current changes. When integrated with the B1500A parameter analyzer, the solution supports current-voltage (IV), pulsed IV, and reliability testing within a unified setup. Together, these capabilities enable comprehensive non-volatile memory (NVM) characterization, helping engineers optimize device performance, improve reliability, and accelerate development workflows.
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How to Accelerate NVM Device Development

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