Trade show
Removing Uncertainty in High-Speed Digital Design - Layer by Layer
When a high-speed link underperforms, how do you determine whether the problem lies in the transmitter, receiver, channel, measurement setup, or available operating margin?
As data rates increase, identifying the true source of performance limitations becomes increasingly challenging. Signal integrity impairments, channel effects, measurement setup limitations, and diminishing design margin can all contribute to unexpected behaviour. Whether you're analyzing eye diagrams, separating jitter components, characterizing channels, correlating measurements, or troubleshooting intermittent link failures, the challenge is often the same: separating symptoms from root causes.
This October, we are bringing Keysight's digital experts to Munich for a practical seminar exploring proven approaches to root-cause analysis, channel characterization, measurement correlation, and margin analysis across PCIe, Ethernet, and Automotive SerDes applications. Through real-world examples, learn how engineers gain deeper insight into system behaviour and improve confidence in design, validation, and debug decisions.
Whether you're developing next-generation PCIe systems, validating automotive SerDes links, or troubleshooting challenging signal integrity issues, this seminar will provide practical insights you can apply immediately. Click for more details on the individual sessions, as well as to register for your complimentary pass for this one day event. In addition to the presentations, there will be opportunities during breaks and at the end of the session to speak directly with Keysight experts about your own design, validation, and troubleshooting challenges.
Engineeers involved in design, validation, testing and troubleshooting of hish-speed digital systems, including Signal Integrity Engineers, Hardware Designers, Validation and Test Engineers, System Architects, and Compliance Engineers working with PCIe, Ethernet, Automotive SerDes, PAM4, NRZ, and other high-speed serial interfaces.
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