How to Measure Capacitor Leakage Current

Get Quote
Femto / Picoammeter
+ Femto / Picoammeter
Femto / Picoammeter
+ Femto / Picoammeter

Measure Capacitor Leakage Current Accurately

Capacitor leakage current measurement requires applying a controlled test voltage while monitoring extremely small current levels after the device reaches a stable condition. The measurement setup must include a voltage source and a high-resolution current measurement device capable of resolving picoampere or femtoampere-level currents while maintaining stability during transient conditions.

The measurement process involves charging the capacitor, allowing transient effects such as dielectric absorption and charging current to decay, and then capturing the steady-state leakage current. Accurate results depend on proper timing, noise reduction techniques, appropriate measurement configurations for floating or grounded devices, and careful control of test conditions to ensure repeatable and reliable data.

Capacitor Leakage Measurement Solution

Capacitor leakage current measurement requires applying a stable voltage source and accurately measuring extremely small currents after transient effects settle. The solution integrates an electrometer with a built-in voltage source and high-resolution current measurement capability. It supports flexible configurations for both floating and grounded devices, enabling broader application coverage. The system includes advanced measurement functions such as time-based sampling, graphical visualization of leakage behavior, and automated sweep measurements. Additional features such as ultra-high resolution down to femtoampere levels, programmable voltage sourcing, and noise reduction techniques allow precise and repeatable leakage current characterization.
Get Quote

See Block Diagram of Capacitor Leakage Measurement Solution

How to Measure Capacitor Leakage Current

Explore Products for Our Capacitor Leakage Measurement Solution

Related Use Cases

How to Measure Insulating Material Resistivity

Measure surface and volume resistivity of insulating materials with high accuracy using electrometers and resistivity cells.

Learn More

How to Perform Combined IV CV Measurements

Perform accurate IV and CV measurements in one setup using a unified switching architecture for semiconductor device characterization.

Learn More

How to Perform VCSEL LIV Testing

Perform accurate VCSEL LIV measurements using synchronized pulsed SMU channels for optical device characterization.

Learn More

contact us logo

Get in Touch with One of Our Experts

Need help finding the right solution for you?

Contact Us