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olutions/facets/design-and-test-product/meter,keysight:models/e4/e4981b
Comment caractériser la permittivité diélectrique en fonction de la fréquence
Déterminer la permittivité diélectrique et la perte diélectrique en fonction de la fréquence à l'aide de mesures de capacité de précision, à des fins d'analyse des matériaux et de validation de la conception, à l'aide d'un capacimètre.
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