Enhancing Test Coverage Analysis with Keysight x1149

Application Notes

Ensuring the accuracy and efficiency of board testing procedures in electronic design and testing is crucial. One method that Original Equipment Manufacturers (OEMs) employ is Design for Testability (DFT) analysis. DFT analysis aims to validate the correctness of the BSCAN (Boundary-Scan) design implemented to enhance the testability of the board.

The complexity of modern designs, especially those featuring more than 10 devices in the BSCAN chain, often poses challenges in efficiently analyzing schematics. Conventional methods, such as reading design documents in PDF format, lack convenient searchability options. Furthermore, the manual analysis of intricate schematics is susceptible to human errors.

The Keysight BSCAN DFT report emerges as a valuable tool that provides early insights into the design depth of the BSCAN chain. By inputting the initial schematic, netlist, and BSDL files into the x1149 software, it automatically reviews the BSCAN design and generates a comprehensive DFT report for its user. This report verifies the correctness of the BSCAN chain layout and ensures the proper design of BSCAN compliance pins as per the BSDL files, if applicable. Moreover, it examines potential fan-out constraints that could lead to signal integrity issues during DFT analysis.

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Enhancing Test Coverage Analysis with Keysight x1149

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