Column Control DTX

Maximizing Testing Efficiency with keysight's x1149 Boundary Scan Analyzer 2.0

Application Notes

Keysight's x1149 Boundary Scan Analyzer 2.0 is a powerful tool for testing interconnects between ICs, eliminating the need for physical probes. This version upgrade, compliant with the IEEE 1149.1-2013 standard, unlocks a range of testing capabilities, including register mnemonic, IC reset control, power domain support, and more. This paper explores the performance enhancements gained by upgrading to the x1149 Boundary Scan Analyzer 2.0, addressing challenges like BSDL parsing time, memory usage, and test node support.

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Column Control DTX